Peter Domanski

Orcid: 0000-0001-5283-2712

According to our database1, Peter Domanski authored at least 19 papers between 2021 and 2026.

Collaborative distances:

Timeline

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Bibliography

2026
TIDE-S: Telemetry Informed Delay Testing With Optimized Sensor Placement.
IEEE Trans. Very Large Scale Integr. Syst., April, 2026

Data-driven Optimization using Deep Reinforcement Learning with Applications in Semiconductor Testing and Digital Healthcare.
PhD thesis, 2026

Focus Session: Do Agentic LLMs Change the Paradigm of Hardware Test Generation?
Proceedings of the Design, Automation & Test in Europe Conference, 2026

2025
Large Language Models (LLMs) for Electronic Design Automation (EDA).
CoRR, August, 2025

ChipMnd: LLMs for Agile Chip Design.
Proceedings of the 43rd IEEE VLSI Test Symposium, 2025

Silent Data Corruption: Advancing Detection, Diagnosis, and Mitigation Strategies.
Proceedings of the 43rd IEEE VLSI Test Symposium, 2025

Large Language Models (LLMs) for Electronic Design Automation (EDA) : Special Session Paper.
Proceedings of the 38th IEEE International System-on-Chip Conference, 2025

TIDE: Telemetry-Informed Delay Testing for Silent Data Corruption <sup>*</sup>.
Proceedings of the IEEE International Test Conference, 2025

LLM-Aided In-Field Workload Generation for Detecting Silent Data Corruptions at Scale.
Proceedings of the IEEE International Test Conference, 2025

2024
Large Language Models to Generate System-Level Test Programs Targeting Non-functional Properties.
CoRR, 2024

hws: A Tool for Monitoring Hardware Metrics Across Diverse Vendors: A Case Study on Hyperparameter Optimization Algorithms.
Proceedings of the SC24-W: Workshops of the International Conference for High Performance Computing, 2024

ML-TIME: ML-driven Timing Analysis of Integrated Circuits in the Presence of Process Variations and Aging Effects.
Proceedings of the 2024 ACM/IEEE International Symposium on Machine Learning for CAD, 2024

Training Large Language Models for System-Level Test Program Generation Targeting Non-functional Properties.
Proceedings of the IEEE European Test Symposium, 2024

Large Language Model-Based Optimization for System-Level Test Program Generation.
Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2024

2023
Blood Glucose Prediction for Type-1 Diabetics using Deep Reinforcement Learning.
Proceedings of the IEEE International Conference on Digital Health, 2023

Learn to Tune: Robust Performance Tuning in Post-Silicon Validation.
Proceedings of the IEEE European Test Symposium, 2023

2022

2021
Self-Learning Tuning for Post-Silicon Validation.
CoRR, 2021

ORSA: Outlier Robust Stacked Aggregation for Best- and Worst-Case Approximations of Ensemble Systems.
Proceedings of the 20th IEEE International Conference on Machine Learning and Applications, 2021


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