Peter Domanski

According to our database, Peter Domanski authored at least 18 papers between 2021 and 2026.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2026

TIDE-S: Telemetry Informed Delay Testing With Optimized Sensor Placement.

Deepesh Sahoo, Eduardo Ortega, Peter Domanski, Farshad Firouzi, Krishnendu Chakrabarty

IEEE Trans. Very Large Scale Integr. Syst., April, 2026

Data-driven Optimization using Deep Reinforcement Learning with Applications in Semiconductor Testing and Digital Healthcare.

Peter Domanski

PhD thesis, 2026

2025

Large Language Models (LLMs) for Electronic Design Automation (EDA).

Kangwei Xu, Denis Schwachhofer, Jason Blocklove, Ilia Polian, Peter Domanski, Dirk Pflüger, Siddharth Garg, Ramesh Karri, Ozgur Sinanoglu, Johann Knechtel, Zhuorui Zhao, Ulf Schlichtmann, Bing Li

CoRR, August, 2025

ChipMnd: LLMs for Agile Chip Design.

Farshad Firouzi, David Z. Pan, Jiaqi Gu, Bahar J. Farahani, Jayeeta Chaudhuri, Ziang Yin, Pingchuan Ma, Peter Domanski, Krishnendu Chakrabarty

Proceedings of the 43rd IEEE VLSI Test Symposium, 2025

Silent Data Corruption: Advancing Detection, Diagnosis, and Mitigation Strategies.

Peter Domanski, Mukarram Ali Faridi, Gabriel Kaunang, Wilson Pradeep, Adit D. Singh, Muhammad Alfian Amrizal, Yanjing Li, Farshad Firouzi, Krishnendu Chakrabarty

Proceedings of the 43rd IEEE VLSI Test Symposium, 2025

Large Language Models (LLMs) for Electronic Design Automation (EDA) : Special Session Paper.

Kangwei Xu, Denis Schwachhofer, Jason Blocklove, Ilia Polian, Peter Domanski, Dirk Pflüger, Siddharth Garg, Ramesh Karri, Ozgur Sinanoglu, Johann Knechtel, Zhuorui Zhao, Ulf Schlichtmann, Bing Li

Proceedings of the 38th IEEE International System-on-Chip Conference, 2025

TIDE: Telemetry-Informed Delay Testing for Silent Data Corruption ^*.

Deepesh Sahoo, Eduardo Ortega, Peter Domanski, Farshad Firouzi, Krishnendu Chakrabarty

Proceedings of the IEEE International Test Conference, 2025

LLM-Aided In-Field Workload Generation for Detecting Silent Data Corruptions at Scale.

Peter Domanski, Deepesh Sahoo, Eduardo Ortega, Farshad Firouzi, Krishnendu Chakrabarty

Proceedings of the IEEE International Test Conference, 2025

2024

Large Language Models to Generate System-Level Test Programs Targeting Non-functional Properties.

Denis Schwachhofer, Peter Domanski, Steffen Becker, Stefan Wagner, Matthias Sauer, Dirk Pflüger, Ilia Polian

CoRR, 2024

hws: A Tool for Monitoring Hardware Metrics Across Diverse Vendors: A Case Study on Hyperparameter Optimization Algorithms.

Marcel Breyer, Alexander Van Craen, Peter Domanski, Dirk Pflüger

Proceedings of the SC24-W: Workshops of the International Conference for High Performance Computing, 2024

ML-TIME: ML-driven Timing Analysis of Integrated Circuits in the Presence of Process Variations and Aging Effects.

Xuanyi Tan, Peter Domanski, Sanmitra Banerjee, Krishnendu Chakrabarty

Proceedings of the 2024 ACM/IEEE International Symposium on Machine Learning for CAD, 2024

Training Large Language Models for System-Level Test Program Generation Targeting Non-functional Properties.

Denis Schwachhofer, Peter Domanski, Steffen Becker, Stefan Wagner, Matthias Sauer, Dirk Pflüger, Ilia Polian

Proceedings of the IEEE European Test Symposium, 2024

Large Language Model-Based Optimization for System-Level Test Program Generation.

Denis Schwachhofer, Peter Domanski, Steffen Becker, Stefan Wagner, Matthias Sauer, Dirk Pflüger, Ilia Polian

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2024

2023

Blood Glucose Prediction for Type-1 Diabetics using Deep Reinforcement Learning.

Peter Domanski, Aritra Ray, Farshad Firouzi, Kyle Lafata, Krishnendu Chakrabarty, Dirk Pflüger

Proceedings of the IEEE International Conference on Digital Health, 2023

Learn to Tune: Robust Performance Tuning in Post-Silicon Validation.

Peter Domanski, Dirk Pflüger, Raphaël Latty

Proceedings of the IEEE European Test Symposium, 2023

2022

Intelligent Methods for Test and Reliability.

Hussam Amrouch, Jens Anders, Steffen Becker, Maik Betka, Gerd Bleher, Peter Domanski, Nourhan Elhamawy, Thomas Ertl, Athanasios Gatzastras, Paul R. Genssler, Sebastian Hasler, Martin Heinrich, André van Hoorn, Hanieh Jafarzadeh, Ingmar Kallfass, Florian Klemme, Steffen Koch, Ralf Küsters, Andrés Lalama, Raphaël Latty, Yiwen Liao, Natalia Lylina, Zahra Paria Najafi-Haghi, Dirk Pflüger, Ilia Polian, Jochen Rivoir, Matthias Sauer, Denis Schwachhofer, Steffen Templin, Christian Volmer, Stefan Wagner, Daniel Weiskopf, Hans-Joachim Wunderlich, Bin Yang, Martin Zimmermann

Proceedings of the 2022 Design, Automation & Test in Europe Conference & Exhibition, 2022

2021

Self-Learning Tuning for Post-Silicon Validation.

Peter Domanski, Dirk Pflüger, Jochen Rivoir, Raphaël Latty

CoRR, 2021

ORSA: Outlier Robust Stacked Aggregation for Best- and Worst-Case Approximations of Ensemble Systems.

Peter Domanski, Dirk Pflüger, Raphaël Latty, Jochen Rivoir

Proceedings of the 20th IEEE International Conference on Machine Learning and Applications, 2021