Doohwang Chang

According to our database, Doohwang Chang authored at least 9 papers between 2011 and 2021.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2021

Maintaining NIST-Traceability for MEMS Sensors via In-Field Electrical Recalibration.

Ishaan Bassi, Sule Ozev, Doohwang Chang

Proceedings of the 39th IEEE VLSI Test Symposium, 2021

2020

In-Field Recovery of RF Circuits from Wearout Based Performance Degradation.

Doohwang Chang, Jennifer N. Kitchen, Sayfe Kiaei, Sule Ozev

IEEE Trans. Emerg. Top. Comput., 2020

2018

Detection Mechanisms for Unauthorized Wireless Transmissions.

Doohwang Chang, Ganapati Bhat, Ümit Y. Ogras, Bertan Bakkaloglu, Sule Ozev

ACM Trans. Design Autom. Electr. Syst., 2018

2016

Design-Time Reliability Enhancement Using Hotspot Identification for RF Circuits.

Doohwang Chang, Jennifer N. Kitchen, Bertan Bakkaloglu, Sayfe Kiaei, Sule Ozev

IEEE Trans. Very Large Scale Integr. Syst., 2016

Post-production adaptation of RF circuits for application-specific performance metrics.

Doohwang Chang, Jennifer Kitchen, Sule Ozev

Proceedings of the IEEE International Symposium on Circuits and Systems, 2016

2015

Enabling unauthorized RF transmission below noise floor with no detectable impact on primary communication performance.

Doohwang Chang, Bertan Bakkaloglu, Sule Ozev

Proceedings of the 33rd IEEE VLSI Test Symposium, 2015

2014

Reliability enhancement using in-field monitoring and recovery for RF circuits.

Doohwang Chang, Sule Ozev, Bertan Bakkaloglu, Sayfe Kiaei, Engin Afacan, Günhan Dündar

Proceedings of the 32nd IEEE VLSI Test Symposium, 2014

Approximating the age of RF/analog circuits through re-characterization and statistical estimation.

Doohwang Chang, Sule Ozev, Ozgur Sinanoglu, Ramesh Karri

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014

2011

Analysis and Mitigation of Electromigration in RF Circuits: An LNA Case Study.

Ramachandran Venkatasubramanian, Doohwang Chang, Sule Ozev

Proceedings of the 16th European Test Symposium, 2011