E. M. Bazizi

According to our database, E. M. Bazizi authored at least 8 papers between 2014 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

BEOL Interconnect Innovation: Materials, Process and Systems Co-optimization for 3nm Node and Beyond.

Gaurav Thareja, Ashish Pal, Xingye Wang, Sefa Dag, Shi You, Shashank Sharma, Qing Zhu, Carmen L. Cervantes, Shinjae Hwang, Matthew Spuller, Ben Ng, Pradeep S. Kumar, Norman Tam, Max Gage, Sameer Deshpande, Zhiyuan Wu, Alexander Jansen, Liton Dey, Feng Chen, Xianjin Xie, Keyvan Kashefizadeh, Vinod Reddy, Andy Lo, Zhebo Chen, Sidney Huey, Jianshe Tang, He Ren, Mehul Naik, Brian Brown, Sree Kesapragada, Buvna Ayyagari-Sangamalli, El Mehdi Bazizi, Xianmin Tang

Proceedings of the 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2023

Contact Cavity Shaping and Selective SiGe: B Low-Temperature Epitaxy Process Solution for sub 10^-9 Ω.cm² Contact Resistivity in Nonplanar FETs.

N. Breil, B.-C. Lee, J. Avila Avendano, J. Jewell, M. Vellaikal, E. Newman, E. M. Bazizi, A. Pal, L. Liu, Oleg Gluschenkov, A. Greene, S. Mochizuki, Nicolas Loubet, B. Colombeau, B. Haran

Proceedings of the 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2023

2021

Integration scheme for 3D NAND with nonreplacement word line and its cell characteristics investigation.

Liu Jiang, Chang Seok Kang, Ashish Pal, El Mehdi Bazizi, Tomohiko Kitajima, Nancy Fung, Gabriela Alva, Amy Child, Bhaskar Bhuyan, Takehito Koshizawa, Sung-Kwan Kang, Gill Lee, David Hwang, Blessy Alexander, Buvna Ayyagari

Proceedings of the IEEE International Memory Workshop, 2021

2020

Modeling and Optimization of Advanced 3D NAND Memory.

Mehdi Saremi, Ashish Pal, Liu Jiang, El Mehdi Bazizi, Helen Lee, Xi-Wei Lin, Blessy Alexander, Buvna Ayyagari-Sangamalli

Proceedings of the 2020 Device Research Conference, 2020

2019

TCAD Simulation on FinFET n-type Power Device HCI Reliability Improvement.

Benyuan Zhu, E. M. Bazizi, J. H. M. Tng, Z. Li, E. K. Banghart, M. K. Hassan, Y. Hu, D. Zhou, D. Choi, L. Qin, Xuan Wan

Proceedings of the IEEE International Reliability Physics Symposium, 2019

Low-Frequency Noise Reduction in 22FDX®: Impact of Device Geometry and Back Bias.

Luca Pirro, Alban Zaka, Olaf Zimmerhackl, T. Hermann, Michael Otto, E. M. Bazizi, Jan Hoentschel, X. Li, R. Taylor

Proceedings of the IEEE International Reliability Physics Symposium, 2019

Highly-Doped Through-Contact Silicon Epi Design at 3 nm node.

Sushant Mittal, Ashish Pal, Mehdi Saremi, J. Ferrell, M. Haverty, T. Miyashita, N. Kim, El Mehdi Bazizi, Blessy Alexander, A. B. Sachid, Buvna Ayyagari

Proceedings of the Device Research Conference, 2019

2014

Advanced TCAD for predictive FinFETs Vth mismatch using full 3D process/device simulation.

E. M. Bazizi, Alban Zaka, Tom Herrmann, Francis Benistant, J. H. M. Tin, J. P. Goh, L. Jiang, M. Joshi, H. van Meer, K. Korablev

Proceedings of the 44th European Solid State Device Research Conference, 2014