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F. Perrier

According to our database1, F. Perrier authored at least 3 papers between 2005 and 2006.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

Legend:

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In proceedings 
Article 
PhD thesis 
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Links

On csauthors.net:

Bibliography

2006
Designing in reliability in advanced CMOS technologies.
[BibTeX]
[DOI]
C. R. Parthasarathy
,
M. Denais
,
Vincent Huard
,
G. Ribes
,
David Roy
,
Chloe Guérin
,
F. Perrier
,
E. Vincent
,
Alain Bravaix
Microelectron. Reliab., 2006

2005
A thorough investigation of MOSFETs NBTI degradation.
[BibTeX]
[DOI]
Vincent Huard
,
M. Denais
,
F. Perrier
,
Nathalie Revil
,
C. R. Parthasarathy
,
Alain Bravaix
,
E. Vincent
Microelectron. Reliab., 2005

Impacts of the recovery phenomena on the worst-case of damage in DC/AC stressed ultra-thin NO gate-oxide MOSFETs.
[BibTeX]
[DOI]
Alain Bravaix
,
Didier Goguenheim
,
M. Denais
,
Vincent Huard
,
C. R. Parthasarathy
,
F. Perrier
,
Nathalie Revil
,
E. Vincent
Microelectron. Reliab., 2005


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