Fei Lu

According to our database, Fei Lu authored at least 15 papers between 2013 and 2020.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2020

A Study of Transient Voltage Peaking in Diode-Based ESD Protection Structures in 28nm CMOS.

Chenkun Wang, Feilong Zhang, Fei Lu, Qi Chen, Cheng Li, Albert Z. Wang

IEEE Access, 2020

2019

A Full-Chip ESD Protection Circuit Simulation and Fast Dynamic Checking Method Using SPICE and ESD Behavior Models.

Feilong Zhang, Chenkun Wang, Fei Lu, Qi Chen, Cheng Li, X. Shawn Wang, Daguang Li, Albert Z. Wang

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2019

2018

A study of impacts of ESD protection on 28/38GHz RF switches in 45nm SOI CMOS for 5G mobile applications.

Chenkun Wang, Fei Lu, Qi Chen, Feilong Zhang, Cheng Li, Dawn Wang, Albert Z. Wang

Proceedings of the 2018 IEEE Radio and Wireless Symposium, 2018

2017

More-Than-Moore: 3D heterogeneous integration into CMOS technologies.

Albert Z. Wang, Qi Chen, Cheng Li, Fei Lu, Chenkun Wang, Feilong Zhang, X. Shawn Wang, Jimmy Ng, Ya-Hong Xie, Rui Ma, Li Wang, Lin Lin

Proceedings of the 12th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, 2017

TLP measurement and analysis of graphene NEMS switches for on-chip ESD protection.

Qi Chen, Cheng Li, Fei Lu, Chenkun Wang, Feilong Zhang, Albert Z. Wang, Jimmy Ng, Ya-Hong Xie

Proceedings of the 12th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, 2017

Key note: Integrated design-for-reliability for ICs.

Albert Z. Wang, Fei Lu, Qi Chen, Chenkun Wang, Cheng Li, Feilong Zhang

Proceedings of the 8th IEEE Latin American Symposium on Circuits & Systems, 2017

Characterization of single-crystalline graphene ESD interconnects.

Qi Chen, Cheng Li, Fei Lu, Chenkun Wang, Feilong Zhang, Tianru Wu, Xiaoming Xie, Kun Zhang, Xinxin Li, Jimmy Ng, Ya-Hong Xie, Yuhua Cheng, Albert Z. Wang

Proceedings of the 12th IEEE International Conference on ASIC, 2017

2016

A Systematic Study of ESD Protection Co-Design With High-Speed and High-Frequency ICs in 28 nm CMOS.

Fei Lu, Rui Ma, Zongyu Dong, Li Wang, Chen Zhang, Chenkun Wang, Qi Chen, X. Shawn Wang, Feilong Zhang, Cheng Li, He Tang, Yuhua Cheng, Albert Z. Wang

IEEE Trans. Circuits Syst. I Regul. Pap., 2016

2015

TLP evaluation of ESD protection capability of graphene micro-ribbons for ICs.

Wei Zhang, Qi Chen, Ming Xia, Rui Ma, Fei Lu, Chenkun Wang, Albert Z. Wang, Ya-Hong Xie

Proceedings of the 2015 IEEE 11th International Conference on ASIC, 2015

Function-based ESD protection circuit design verification for BGA pad-ring array.

Li Wang, Rui Ma, Fei Lu, Albert Z. Wang, Zongyu Dong, Xin Wang, Chen Zhang, Bin Zhao, Siqiang Fan, He Tang

Proceedings of the 2015 IEEE 11th International Conference on ASIC, 2015

2014

Concurrent Design Analysis of High-Linearity SP10T Switch With 8.5 kV ESD Protection.

X. Shawn Wang, Xin Wang, Fei Lu, Chen Zhang, Zongyu Dong, Li Wang, Rui Ma, Zitao Shi, Albert Z. Wang, Mau-Chung Frank Chang, Dawn Wang, Alvin J. Joseph, C. Patrick Yue

IEEE J. Solid State Circuits, 2014

Scalable behavior modeling for SCR based ESD protection structures for circuit simulation.

Li Wang, Rui Ma, Chen Zhang, Zongyu Dong, Fei Lu, Albert Z. Wang, Xin Wang, Jian Liu, Siqiang Fan, He Tang, Baoyong Chi, Liji Wu, Tianling Ren

Proceedings of the IEEE International Symposium on Circuits and Systemss, 2014

2013

Heterogeneous integration of nano enabling devices for 3D ICs.

Li Wang, Rui Ma, Chen Zhang, Zongyu Dong, Xin Wang, Zitao Shi, Jian Liu, Lin Lin, Hui Zhao, Fei Lu, Qiang Fang, Chen Yang, Jing Zhan, Tianling Ren, Xinxin Li, Ru Huang, Albert Z. Wang

Proceedings of the International Symposium on Low Power Electronics and Design (ISLPED), 2013

Scalable behavior modeling for 3D field-programmable ESD protection structures.

Li Wang, Xin Wang, Zitao Shi, Rui Ma, Chen Zhang, Zongyu Dong, Fei Lu, Hui Zhao, Albert Z. Wang

Proceedings of the IEEE 2013 Custom Integrated Circuits Conference, 2013

A smartphone SP10T T/R switch in 180-nm SOI CMOS with 8kV+ ESD protection by co-design.

X. Shawn Wang, Xin Wang, Fei Lu, Li Wang, Rui Ma, Zongyu Dong, Li Sun, Albert Z. Wang, C. Patrick Yue, Dawn Wang, Alvin J. Joseph

Proceedings of the IEEE 2013 Custom Integrated Circuits Conference, 2013