Frédéric Lalande

According to our database, Frédéric Lalande authored at least 7 papers between 2007 and 2012.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2012

Investigation of the effects of constant voltage stress on thin SiO₂ layers using dynamic measurement protocols.

Philippe Chiquet, Pascal Masson, Romain Laffont, Gilles Micolau, Jérémy Postel-Pellerin, Frédéric Lalande, Bernard Bouteille, Jean-Luc Ogier

Microelectron. Reliab., 2012

2010

Leakage paths identification in NVM using biased data retention.

Jérémy Postel-Pellerin, Romain Laffont, Gilles Micolau, Frédéric Lalande, Arnaud Régnier, Bernard Bouteille

Microelectron. Reliab., 2010

2009

A Modelisation of the temperature dependence of the Fowler-Nordheim current in EEPROM memories.

M. Roca, Romain Laffont, Gilles Micolau, Frédéric Lalande, O. Pizzuto

Microelectron. Reliab., 2009

Modeling charge variation during data retention of MLC Flash memories.

Jérémy Postel-Pellerin, Frédéric Lalande, Pierre Canet, Rachid Bouchakour, F. Jeuland, L. Morancho

Microelectron. Reliab., 2009

Extraction of 3D parasitic capacitances in 90 nm and 22 nm NAND flash memories.

Jérémy Postel-Pellerin, Frédéric Lalande, Pierre Canet, Rachid Bouchakour, F. Jeuland, B. Bertello, B. Villard

Microelectron. Reliab., 2009

2008

Flash Memory Cell Compact Modeling Using PSP Model.

Anthony Maure, Pierre Canet, Frédéric Lalande, Bertrand Delsuc, Jean Devin

Proceedings of the 2008 IEEE International Behavioral Modeling and Simulation Workshop, 2008

2007

A new method to quantify retention-failed cells of an EEPROM CAST.

Claire Le Roux, Laurent Lopez, Abdellatif Firiti, Jean-Luc Ogier, Frédéric Lalande, Romain Laffont, Gilles Micolau

Microelectron. Reliab., 2007