Anis Uzzaman

According to our database, Anis Uzzaman authored at least 16 papers between 2005 and 2010.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2010

Reduction of Test Data Volume and Improvement of Diagnosability Using Hybrid Compression.

Anis Uzzaman, Brion L. Keller, Brian Foutz, Sandeep Bhatia, Thomas Bartenstein, Masayuki Arai, Kazuhiko Iwasaki

IEICE Trans. Inf. Syst., 2010

2009

Automatic Handling of Programmable On-Product Clock Generation (OPCG) Circuitry for Low Power Aware Delay Test.

Anis Uzzaman, Brion L. Keller, Thomas J. Snethen, Kazuhiko Iwasaki, Masayuki Arai

J. Low Power Electron., 2009

Is Low Power Testing Necessary? What does the Test Industry Truly Need?.

Anis Uzzaman

Proceedings of the Eighteentgh Asian Test Symposium, 2009

A Partially-Exhaustive Gate Transition Fault Model.

Brion L. Keller, Dale Meehl, Anis Uzzaman, Richard Billings

Proceedings of the Eighteentgh Asian Test Symposium, 2009

Why is Conventional ATPG Not Sufficient for Advanced Low Power Designs?.

Krishna Chakravadhanula, Vivek Chickermane, Brion L. Keller, Patrick R. Gallagher Jr., Anis Uzzaman

Proceedings of the Eighteentgh Asian Test Symposium, 2009

2008

How To Increase the Effectiveness of Yield Diagnostics-Is DFM the Answer to This?

Anis Uzzaman

Proceedings of the 17th IEEE Asian Test Symposium, 2008

Optimizing Test Data Volume Using Hybrid Compression.

Brion L. Keller, Sandeep Bhatia, Thomas Bartenstein, Brian Foutz, Anis Uzzaman

Proceedings of the 17th IEEE Asian Test Symposium, 2008

2007

Automated handling of programmable on-product clock generation (OPCG) circuitry for delay test vector generation.

Anis Uzzaman, Bibo Li, Thomas J. Snethen, Brion L. Keller, Gary Grise

Proceedings of the 2007 IEEE International Test Conference, 2007

Test Roles in Diagnosis and Silicon Debug.

Anis Uzzaman, Fidel Muradali, Takashi Aikyo, Robert C. Aitken, Tom Jackson, Rajesh Galivanche, Takeshi Onodera

Proceedings of the 16th Asian Test Symposium, 2007

Using Programmable On-Product Clock Generation (OPCG) for Delay Test.

Brion L. Keller, Anis Uzzaman, Bibo Li, Thomas J. Snethen

Proceedings of the 16th Asian Test Symposium, 2007

A Review of Power Strategies for DFT and ATPG.

Brion L. Keller, Tom Jackson, Anis Uzzaman

Proceedings of the 16th Asian Test Symposium, 2007

2006

Not all Delay Tests Are the Same - SDQL Model Shows True-Time.

Anis Uzzaman, Mick Tegethoff, Bibo Li, Kevin McCauley, Shuji Hamada, Yasuo Sato

Proceedings of the 15th Asian Test Symposium, 2006

A Scalable Architecture for On-Chip Compression: Options and Trade-Offs.

Anis Uzzaman, Brion L. Keller, Vivek Chickermane

Proceedings of the 15th Asian Test Symposium, 2006

Early Life Cycle Yield Learning for Nanometer Devices Using Volume Yield Diagnostics Analysis.

Sanae Seike, Ken Namura, Yukio Ohya, Anis Uzzaman, Shinichi Arima, Dale Meehl, Vivek Chickermane, Azumi Kobayashi, Satoshi Tanaka, Hiroyuki Adachi

Proceedings of the 15th Asian Test Symposium, 2006

2005

Low Cost Delay Testing of Nanometer SoCs Using On-Chip Clocking and Test Compression.

Hiroyuki Nakamura, Akio Shirokane, Yoshihito Nishizaki, Anis Uzzaman, Vivek Chickermane, Brion L. Keller, Tsutomu Ube, Yoshihiko Terauchi

Proceedings of the 14th Asian Test Symposium (ATS 2005), 2005

Practical Aspects of Delay Testing for Nanometer Chips.

Vivek Chickermane, Brion L. Keller, Kevin McCauley, Anis Uzzaman

Proceedings of the 14th Asian Test Symposium (ATS 2005), 2005