Geneviève Duchamp

According to our database, Geneviève Duchamp authored at least 15 papers between 2002 and 2025.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of four.

2025

Investigation Into the Moisture Degradation Mechanism of Integrated Stacks Using New Moisture Sensor Design.

B. Ayoub, G. Imbert, F. Belfis, T. Parrassin, Sébastien Gallois-Garreignot, L. Mischler, Geneviève Duchamp, Hélène Frémont

Proceedings of the IEEE International Reliability Physics Symposium, 2025

2024

Susceptibility of an Analog Temperature Measurement Function: First Step to Optimize the IEMI Waveform.

Antoine Duguet, Tristan Dubois, Geneviève Duchamp, David Hardy, Franck Salvador

Proceedings of the 14th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, 2024

2018

Effects of HPEM stress on GaAs low-noise amplifier from circuit to component scale.

M. Girard, Tristan Dubois, Patrick Hoffmann, Geneviève Duchamp

Microelectron. Reliab., 2018

2017

Effects of ageing on the conducted immunity of a voltage reference: Experimental study and modelling approach.

S. Hairoud-Airieau, Geneviève Duchamp, Tristan Dubois, Jean-Yves Delétage, André Durier, Hélène Frémont

Microelectron. Reliab., 2017

2015

A New Method for the Characterization of Electronic Components Immunity.

Ala Ayed, Tristan Dubois, Jean-Luc Levant, Geneviève Duchamp

IEEE Trans. Instrum. Meas., 2015

Characterization and model of temperature effect on the conducted immunity of Op-Amp.

Tristan Dubois, Siham Hairoud, Marcio Hermany Gomes de Oliveira, Hélène Frémont, Geneviève Duchamp

Microelectron. Reliab., 2015

Failure mechanism study and immunity modeling of an embedded analog-to-digital converter based on immunity measurements.

Ala Ayed, Tristan Dubois, Jean-Luc Levant, Geneviève Duchamp

Microelectron. Reliab., 2015

2014

Qualification procedure for moisture in embedded capacitors.

Hélène Frémont, Jörg Kludt, Massar Wade, Kirsten Weide-Zaage, Isabelle Bord-Majek, Geneviève Duchamp

Microelectron. Reliab., 2014

2013

Conducted immunity of three Op-Amps using the DPI measurement technique and VHDL-AMS modeling.

Siham Hairoud, Tristan Dubois, Angelique Tetelin, Geneviève Duchamp

Proceedings of the 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits, 2013

2012

A methodological approach for predictive reliability: Practical case studies.

Hélène Frémont, Geneviève Duchamp, Alexandrine Guédon-Gracia, Frédéric Verdier

Microelectron. Reliab., 2012

2011

Control of the electromagnetic compatibility: An issue for IC reliability.

Jean-Baptiste Gros, Geneviève Duchamp, Jean-Luc Levant, Christian Marot

Microelectron. Reliab., 2011

2009

Electromagnetic immunity model of an ADC for microcontroller's reliability improvement.

Jean-Baptiste Gros, Geneviève Duchamp, Alain Meresse, Jean-Luc Levant

Microelectron. Reliab., 2009

2007

Near-field EMC study to improve electronic component reliability.

Geneviève Duchamp, D. Castagnet, Alain Meresse

Microelectron. Reliab., 2007

2004

Reliability of Low-Cost PCB Interconnections for Telecommunication Applications.

Geneviève Duchamp, Frédéric Verdier, Yannick Deshayes, François Marc, Yves Ousten, Yves Danto

Microelectron. Reliab., 2004

2002

Evaluation of a micropackaging analysis technique by highfrequency microwaves.

Geneviève Duchamp, Yves Ousten, Yves Danto

Microelectron. Reliab., 2002