Jean-Yves Delétage

According to our database, Jean-Yves Delétage authored at least 23 papers between 2003 and 2018.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2018

Efficient state of health estimation of Li-ion battery under several ageing types for aeronautic applications.

Yuan Ci Zhang, Olivier Briat, Jean-Yves Delétage, Cyril Martin, Nicolas Chadourne, Jean-Michel Vinassa

Microelectron. Reliab., 2018

Creep measurement and choice of creep laws for BGA assemblies' reliability simulation.

S. Pin, Alexandrine Guédon-Gracia, Jean-Yves Delétage, Hélène Frémont

Microelectron. Reliab., 2018

Effect of HTRB lifetest on AlGaN/GaN HEMTs under different voltages and temperatures stresses.

Omar Chihani, L. Théolier, Alain Bensoussan, Jean-Yves Delétage, André Durier, Eric Woirgard

Microelectron. Reliab., 2018

Sequential combined thermal cycling and vibration test and simulation of printed circuit board.

Faical Arabi, Alexandrine Guédon-Gracia, Jean-Yves Delétage, Hélène Frémont

Microelectron. Reliab., 2018

Temperature and voltage effects on HTRB and HTGB stresses for AlGaN/GaN HEMTs.

Omar Chihani, Loic Théolier, Jean-Yves Delétage, Eric Woirgard, Alain Bensoussan, André Durier

Proceedings of the IEEE International Reliability Physics Symposium, 2018

Characterization of external pressure effects on lithium-ion pouch cell.

Yuan Ci Zhang, Olivier Briat, Jean-Yves Delétage, Cyril Martin, Guillaume Gager, Jean-Michel Vinassa

Proceedings of the IEEE International Conference on Industrial Technology, 2018

2017

Effects of ageing on the conducted immunity of a voltage reference: Experimental study and modelling approach.

S. Hairoud-Airieau, Geneviève Duchamp, Tristan Dubois, Jean-Yves Delétage, André Durier, Hélène Frémont

Microelectron. Reliab., 2017

Performance quantification of latest generation Li-ion batteries in wide temperature range.

Yuan Ci Zhang, Olivier Briat, Jean-Yves Delétage, Cyril Martin, Guillaume Gager, Jean-Michel Vinassa

Proceedings of the IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society, Beijing, China, October 29, 2017

2016

Effects of salt spray test on lead-free solder alloy.

Alexandrine Guédon-Gracia, Hélène Frémont, Bernard Plano, Jean-Yves Delétage, Kirsten Weide-Zaage

Microelectron. Reliab., 2016

Chemical rate phenomenon approach applied to lithium battery capacity fade estimation.

Issam Baghdadi, Olivier Briat, Jean-Yves Delétage, Philippe Gyan, Jean-Michel Vinassa

Microelectron. Reliab., 2016

Power electronic assemblies: Thermo-mechanical degradations of gold-tin solder for attaching devices.

Faical Arabi, Loic Théolier, Donatien Martineau, Jean-Yves Delétage, M. Medina, Eric Woirgard

Microelectron. Reliab., 2016

2013

Conductive adhesive joint for extreme temperature applications.

J. B. Jullien, Hélène Frémont, Jean-Yves Delétage

Microelectron. Reliab., 2013

Electrical characterization under mechanical stress at various temperatures of PiN power diodes in a health monitoring approach.

F. Baccar, Stephane Azzopardi, L. Théolier, K. El Boubkari, Jean-Yves Delétage, Eric Woirgard

Microelectron. Reliab., 2013

2012

A preliminary study on the thermal and mechanical performances of sintered nano-scale silver die-attach technology depending on the substrate metallization.

François Le Henaff, Stephane Azzopardi, Jean-Yves Delétage, Eric Woirgard, Serge Bontemps, Julien Joguet

Microelectron. Reliab., 2012

2011

Ageing monitoring of lithium-ion cell during power cycling tests.

Akram Eddahech, Olivier Briat, Hervé Henry, Jean-Yves Delétage, Eric Woirgard, Jean-Michel Vinassa

Microelectron. Reliab., 2011

How supercapacitors reach end of life criteria during calendar life and power cycling tests.

Ramzi Chaari, Olivier Briat, Jean-Yves Delétage, Eric Woirgard, Jean-Michel Vinassa

Microelectron. Reliab., 2011

2010

Contribution of calendar ageing modes in the performances degradation of supercapacitors during power cycling.

Olivier Briat, Jean-Michel Vinassa, Nicolas Bertrand, H. El Brouji, Jean-Yves Delétage, Eric Woirgard

Microelectron. Reliab., 2010

Experimental electro-mechanical static characterization of IGBT bare die under controlled temperature.

Yassine Belmehdi, Stephane Azzopardi, Jean-Yves Delétage, Eric Woirgard

Microelectron. Reliab., 2010

2009

Uni-axial mechanical stress effect on Trench Punch through IGBT under short-circuit operation.

Yassine Belmehdi, Stephane Azzopardi, A. Benmansour, Jean-Yves Delétage, Eric Woirgard

Microelectron. Reliab., 2009

2004

How to study delamination in plastic encapsulated devices.

Hélène Frémont, Jean-Yves Delétage, Kirsten Weide-Zaage, Yves Danto

Microelectron. Reliab., 2004

2003

Moisture diffusion in BCB resins used for MEMS packaging.

Angie Tetelin, Claude Pellet, Jean-Yves Delétage, B. Carbonne, Yves Danto

Microelectron. Reliab., 2003

Three-dimensional FEM simulations of thermomechanical stresses in 1.55 mum Laser modules.

Yannick Deshayes, Laurent Béchou, Jean-Yves Delétage, Frédéric Verdier, Yves Danto, Dominique Laffitte, Jean-Luc Goudard

Microelectron. Reliab., 2003

Reliability estimation of BGA and CSP assemblies using degradation law model and technological parameters deviations.

Jean-Yves Delétage, F. J.-M. Verdier, Bernard Plano, Yannick Deshayes, Laurent Béchou, Yves Danto

Microelectron. Reliab., 2003