Yannick Deshayes

According to our database1, Yannick Deshayes authored at least 13 papers between 2003 and 2017.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Other 

Links

On csauthors.net:

Bibliography

2017
Practical optical gain by an extended Hakki-Paoli method.
Microelectronics Reliability, 2017

2015
Correlation between forward-reverse low-frequency noise and atypical I-V signatures in 980 nm high-power laser diodes.
Microelectronics Reliability, 2015

Photothermal activated failure mechanism in polymer-based packaging of low power InGaN/GaN MQW LED under active storage.
Microelectronics Reliability, 2015

2013
Durability study of a fluorescent optical memory in glass studied by luminescence spectroscopy.
Microelectronics Reliability, 2013

2010
Effects of silicone coating degradation on GaN MQW LEDs performances using physical and chemical analyses.
Microelectronics Reliability, 2010

2008
Selective activation of failure mechanisms in packaged double-heterostructure light emitting diodes using controlled neutron energy irradiation.
Microelectronics Reliability, 2008

Reliability investigations of 850 nm silicon photodiodes under proton irradiation for space applications.
Microelectronics Reliability, 2008

2005
Electroluminescence spectroscopy for reliability investigations of 1.55 mum bulk semiconductor optical amplifier.
Microelectronics Reliability, 2005

2004
Study of influence of failure modes on lifetime distribution prediction of 1.55 μm DFB Laser diodes using weak drift of monitored parameters during ageing tests.
Microelectronics Reliability, 2004

Reliability of Low-Cost PCB Interconnections for Telecommunication Applications.
Microelectronics Reliability, 2004

2003
Impact of 1.55 mum laser diode degradation laws on fibre optic system performances using a system simulator.
Microelectronics Reliability, 2003

Three-dimensional FEM simulations of thermomechanical stresses in 1.55 mum Laser modules.
Microelectronics Reliability, 2003

Reliability estimation of BGA and CSP assemblies using degradation law model and technological parameters deviations.
Microelectronics Reliability, 2003


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