Geneviève Duchamp

According to our database, Geneviève Duchamp authored at least 13 papers between 2002 and 2018.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of four.

2018

Effects of HPEM stress on GaAs low-noise amplifier from circuit to component scale.

M. Girard, Tristan Dubois, Patrick Hoffmann, Geneviève Duchamp

Microelectron. Reliab., 2018

2017

Effects of ageing on the conducted immunity of a voltage reference: Experimental study and modelling approach.

S. Hairoud-Airieau, Geneviève Duchamp, Tristan Dubois, Jean-Yves Delétage, André Durier, Hélène Frémont

Microelectron. Reliab., 2017

2015

A New Method for the Characterization of Electronic Components Immunity.

Ala Ayed, Tristan Dubois, Jean-Luc Levant, Geneviève Duchamp

IEEE Trans. Instrum. Meas., 2015

Characterization and model of temperature effect on the conducted immunity of Op-Amp.

Tristan Dubois, Siham Hairoud, Marcio Hermany Gomes de Oliveira, Hélène Frémont, Geneviève Duchamp

Microelectron. Reliab., 2015

Failure mechanism study and immunity modeling of an embedded analog-to-digital converter based on immunity measurements.

Ala Ayed, Tristan Dubois, Jean-Luc Levant, Geneviève Duchamp

Microelectron. Reliab., 2015

2014

Qualification procedure for moisture in embedded capacitors.

Hélène Frémont, Jörg Kludt, Massar Wade, Kirsten Weide-Zaage, Isabelle Bord-Majek, Geneviève Duchamp

Microelectron. Reliab., 2014

2013

Conducted immunity of three Op-Amps using the DPI measurement technique and VHDL-AMS modeling.

Siham Hairoud, Tristan Dubois, Angelique Tetelin, Geneviève Duchamp

Proceedings of the 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits, 2013

2012

A methodological approach for predictive reliability: Practical case studies.

Hélène Frémont, Geneviève Duchamp, Alexandrine Guédon-Gracia, Frédéric Verdier

Microelectron. Reliab., 2012

2011

Control of the electromagnetic compatibility: An issue for IC reliability.

Jean-Baptiste Gros, Geneviève Duchamp, Jean-Luc Levant, Christian Marot

Microelectron. Reliab., 2011

2009

Electromagnetic immunity model of an ADC for microcontroller's reliability improvement.

Jean-Baptiste Gros, Geneviève Duchamp, Alain Meresse, Jean-Luc Levant

Microelectron. Reliab., 2009

2007

Near-field EMC study to improve electronic component reliability.

Geneviève Duchamp, D. Castagnet, Alain Meresse

Microelectron. Reliab., 2007

2004

Reliability of Low-Cost PCB Interconnections for Telecommunication Applications.

Geneviève Duchamp, Frédéric Verdier, Yannick Deshayes, François Marc, Yves Ousten, Yves Danto

Microelectron. Reliab., 2004

2002

Evaluation of a micropackaging analysis technique by highfrequency microwaves.

Geneviève Duchamp, Yves Ousten, Yves Danto

Microelectron. Reliab., 2002