Girish Pahwa

According to our database, Girish Pahwa authored at least 8 papers between 2016 and 2021.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2021

On the Resiliency of NCFET Circuits Against Voltage Over-Scaling.

Guilherme Paim, Georgios Zervakis, Girish Pahwa, Yogesh Singh Chauhan, Eduardo Antonio Cesar da Costa, Sergio Bampi, Jörg Henkel, Hussam Amrouch

IEEE Trans. Circuits Syst. I Regul. Pap., 2021

2020

Impact of Variability on Processor Performance in Negative Capacitance FinFET Technology.

Hussam Amrouch, Girish Pahwa, Amol D. Gaidhane, Chetan K. Dabhi, Florian Klemme, Om Prakash, Yogesh Singh Chauhan

IEEE Trans. Circuits Syst. I Regul. Pap., 2020

Impact of Radiation on Negative Capacitance FinFET.

Govind Bajpai, Aniket Gupta, Om Prakash, Girish Pahwa, Jörg Henkel, Yogesh Singh Chauhan, Hussam Amrouch

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

NCFET to Rescue Technology Scaling: Opportunities and Challenges.

Hussam Amrouch, Victor M. van Santen, Girish Pahwa, Yogesh Singh Chauhan, Jörg Henkel

Proceedings of the 25th Asia and South Pacific Design Automation Conference, 2020

2019

NCFET-Aware Voltage Scaling.

Sami Salamin, Martin Rapp, Hussam Amrouch, Girish Pahwa, Yogesh Singh Chauhan, Jörg Henkel

Proceedings of the 2019 IEEE/ACM International Symposium on Low Power Electronics and Design, 2019

Performance, Power and Cooling Trade-Offs with NCFET-based Many-Cores.

Martin Rapp, Sami Salamin, Hussam Amrouch, Girish Pahwa, Yogesh Singh Chauhan, Jörg Henkel

Proceedings of the 56th Annual Design Automation Conference 2019, 2019

2018

Negative Capacitance Transistor to Address the Fundamental Limitations in Technology Scaling: Processor Performance.

Hussam Amrouch, Girish Pahwa, Amol D. Gaidhane, Jörg Henkel, Yogesh Singh Chauhan

IEEE Access, 2018

2016

Designing energy efficient and hysteresis free negative capacitance FinFET with negative DIBL and 3.5X ION using compact modeling approach.

Girish Pahwa, Tapas Dutta, Amit Agarwal, Yogesh Singh Chauhan

Proceedings of the ESSCIRC Conference 2016: 42^nd European Solid-State Circuits Conference, 2016