Gus Chang-Hung Han

According to our database, Gus Chang-Hung Han authored at least 2 papers between 2020 and 2021.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2021

Automatic Inspection for Wafer Defect Pattern Recognition with Unsupervised Clustering.

Katherine Shu-Min Li, Leon Li-Yang Chen, Ken Chau-Cheung Cheng, Peter Yi-Yu Liao, Sying-Jyan Wang, Andrew Yi-Ann Huang, Nova Cheng-Yen Tsai, Leon Chou, Gus Chang-Hung Han, Jwu E. Chen, Hsing-Chung Liang, Chun-Lung Hsu

Proceedings of the 26th IEEE European Test Symposium, 2021

2020

PWS: Potential Wafermap Scratch Defect Pattern Recognition with Machine Learning Techniques.

Katherine Shu-Min Li, Peter Yi-Yu Liao, Leon Chou, Ken Chau-Cheung Cheng, Andrew Yi-Ann Huang, Sying-Jyan Wang, Gus Chang-Hung Han

Proceedings of the IEEE European Test Symposium, 2020