Hans Martin von Staudt

According to our database, Hans Martin von Staudt authored at least 12 papers between 2006 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2022

High-Coverage DfT and Reliability Enhancements for Automotive Floating Gate OTP Beyond AEC-Q100.

Hans Martin von Staudt, Franz Schuler, Rohitaswa Bhattacharya, Justin Wei-Lin Cheng, Cheng-Da Huang, Parker Chih-Chun Chen

Proceedings of the IEEE International Test Conference, 2022

Probeless DfT Scheme for Testing 20k I/Os of an Automotive Micro-LED Headlamp Driver IC.

Hans Martin von Staudt, Luai Tarek Elnawawy, Sarah Wang, Larry Ping, Jung Woo Choi

Proceedings of the IEEE International Test Conference, 2022

IEEE P1687.1: Extending the Network Boundaries for Test.

Michael Laisne, Alfred L. Crouch, Michele Portolan, Martin Keim, Hans Martin von Staudt, Bradford G. Van Treuren, Jeff Rearick, Songlin Zuo

Proceedings of the IEEE International Test Conference, 2022

2021

Exploring and Comparing IEEE P1687.1 and IEEE 1687 Modeling of Non-TAP Interfaces.

Hans Martin von Staudt, Bradford G. Van Treuren, Jeff Rearick, Michele Portolan, Martin Keim

Proceedings of the 26th IEEE European Test Symposium, 2021

2020

Industrial Application of IJTAG Standards to the Test of Big-A/little-d devices.

Hans Martin von Staudt, Mohamed Anas Benhebibi, Jeff Rearick, Michael Laisne

Proceedings of the IEEE International Test Conference, 2020

Modeling Novel Non-JTAG IEEE 1687-Like Architectures.

Mike Laisne, Alfred L. Crouch, Michele Portolan, Martin Keim, Hans Martin von Staudt, M. Abdalwahab, Bradford G. Van Treuren, Jeff Rearick

Proceedings of the IEEE International Test Conference, 2020

2019

Innovative Design for Test in State-of-the-Art Analog Systems.

Hans Martin von Staudt, Amit Majumdar, Bill Taylor, Jennifer Kitchen

Proceedings of the 37th IEEE VLSI Test Symposium, 2019

Innovative Practices on IEEE 1687.xyz.

Jeff Rearick, Alfred L. Crouch, Hans Martin von Staudt

Proceedings of the 37th IEEE VLSI Test Symposium, 2019

2017

Single-pin test control for Big A, little D devices.

Michael Laisne, Hans Martin von Staudt, Sourabh Bhalerao, Mark Eason

Proceedings of the IEEE International Test Conference, 2017

2007

A sophisticated memory test engine for LCD display drivers.

Oliver Spang, Hans Martin von Staudt, Michael G. Wahl

Proceedings of the 2007 Design, Automation and Test in Europe Conference and Exposition, 2007

2006

Test Software Generation Productivity and Code Quality Improvement by applying Software Engineering Techniques.

Stefan Vock, Markus Schmid, Hans Martin von Staudt

Proceedings of the 2006 IEEE International Test Conference, 2006

Productivity and Code Quality Improvement of Mixed-Signal Test Software by Applying Software Engineering Methods.

Stefan Vock, Ulrich Flogaus, Hans Martin von Staudt

Proceedings of the 9th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2006), 2006