Hongxia Fang

Abhijit Jas

Srinivas Patil

Chandra Tirumurti

IEEE Trans. Very Large Scale Integr. Syst., 2012

Diagnosis of Board-Level Functional Failures Under Uncertainty Using Dempster-Shafer Theory.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012

Reproduction and Detection of Board-Level Functional Failure.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012

2011

Design-for-Testability and Diagnosis Methods to target unmodeled Defects in Integrated Circuits and Multi-Chip Boards.

[BibT_eX]

[DOI]

PhD thesis, 2011

Ranking of Suspect Faulty Blocks Using Dataflow Analysis and Dempster-Shafer Theory for the Diagnosis of Board-Level Functional Failures.

[BibT_eX]

[DOI]

Proceedings of the 16th European Test Symposium, 2011

Deterministic test for the reproduction and detection of board-level functional failures.

[BibT_eX]

[DOI]

Proceedings of the 16th Asia South Pacific Design Automation Conference, 2011

2010

RTL DFT Techniques to Enhance Defect Coverage for Functional Test Sequences.

[BibT_eX]

[DOI]

Hideo Fujiwara

J. Electron. Test., 2010

Mimicking of Functional State Space with Structural Tests for the Diagnosis of Board-Level Functional Failures.

[BibT_eX]

[DOI]

Proceedings of the 19th IEEE Asian Test Symposium, 2010

2009

Deviation-Based LFSR Reseeding for Test-Data Compression.

[BibT_eX]

[DOI]

Zhanglei Wang

Michael Bienek

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2009

RT-Level Deviation-Based Grading of Functional Test Sequences.

[BibT_eX]

[DOI]

Abhijit Jas

Srinivas Patil

Chandra Tirumurti

Proceedings of the 27th IEEE VLSI Test Symposium, 2009

Bit-Operation-Based Seed Augmentation for LFSR Reseeding with High Defect Coverage.

[BibT_eX]

[DOI]