Xinli Gu

According to our database, Xinli Gu authored at least 69 papers between 1991 and 2022.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2022

Unsupervised Two-Stage Root-Cause Analysis for Integrated Systems.

Renjian Pan, Zhaobo Zhang, Xin Li, Krishnendu Chakrabarty, Xinli Gu

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022

Knowledge Transfer in Board-Level Functional Fault Diagnosis Enabled by Domain Adaptation.

Mengyun Liu, Xin Li, Krishnendu Chakrabarty, Xinli Gu

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022

2021

Black-Box Test-Cost Reduction Based on Bayesian Network Models.

Renjian Pan, Zhaobo Zhang, Xin Li, Krishnendu Chakrabarty, Xinli Gu

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2021

Board-Level Functional Fault Identification Using Streaming Data.

Mengyun Liu, Fangming Ye, Xin Li, Krishnendu Chakrabarty, Xinli Gu

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2021

2020

Fine-grained Adaptive Testing Based on Quality Prediction.

Mengyun Liu, Renjian Pan, Fangming Ye, Xin Li, Krishnendu Chakrabarty, Xinli Gu

ACM Trans. Design Autom. Electr. Syst., 2020

Self-Learning and Efficient Health-Status Analysis for a Core Router System.

Shi Jin, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020

Hierarchical Symbol-Based Health-Status Analysis Using Time-Series Data in a Core Router System.

Shi Jin, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020

Unsupervised Root-Cause Analysis for Integrated Systems.

Renjian Pan, Zhaobo Zhang, Xin Li, Krishnendu Chakrabarty, Xinli Gu

Proceedings of the IEEE International Test Conference, 2020

2019

Changepoint-Based Anomaly Detection for Prognostic Diagnosis in a Core Router System.

Shi Jin, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2019

Anomaly Detection and Health-Status Analysis in a Core Router System.

Shi Jin, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu

IEEE Des. Test, 2019

IP Session on Machine Learning Applications in IC Test-Related Tasks.

Ghada Sokar, Yassin Zakaria, Asmaa Rabie, Kareem Madkour, Ira Leventhal, Jochen Rivoir, Xinli Gu, Haralampos-G. D. Stratigopoulos

Proceedings of the 37th IEEE VLSI Test Symposium, 2019

Black-Box Test-Coverage Analysis and Test-Cost Reduction Based on a Bayesian Network Model.

Renjian Pan, Zhaobo Zhang, Xin Li, Krishnendu Chakrabarty, Xinli Gu

Proceedings of the 37th IEEE VLSI Test Symposium, 2019

Knowledge Transfer in Board-Level Functional Fault Identification using Domain Adaptation.

Mengyun Liu, Xin Li, Krishnendu Chakrabarty, Xinli Gu

Proceedings of the IEEE International Test Conference, 2019

2018

Toward Predictive Fault Tolerance in a Core-Router System: Anomaly Detection Using Correlation-Based Time-Series Analysis.

Shi Jin, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2018

Self-Learning Health-Status Analysis for a Core Router System.

Shi Jin, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu

Proceedings of the IEEE International Test Conference, 2018

Failure prediction based on anomaly detection for complex core routers.

Shi Jin, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu

Proceedings of the International Conference on Computer-Aided Design, 2018

2017

Symbol-based health-status analysis in a core router system.

Shi Jin, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu

Proceedings of the IEEE International Test Conference, 2017

Changepoint-based anomaly detection in a core router system.

Shi Jin, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu

Proceedings of the IEEE International Test Conference, 2017

Data-driven fault diagnosis with missing syndromes imputation for functional test through conditional specification.

Tong Guan, Zhaobo Zhang, Wen Dong, Chunming Qiao, Xinli Gu

Proceedings of the 22nd IEEE European Test Symposium, 2017

RetroDMR: Troubleshooting non-deterministic faults with retrospective DMR.

Ting Wang, Yannan Liu, Qiang Xu, Zhaobo Zhang, Zhiyuan Wang, Xinli Gu

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2017

2016

Adaptive Board-Level Functional Fault Diagnosis Using Incremental Decision Trees.

Fangming Ye, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2016

Efficient Board-Level Functional Fault Diagnosis With Missing Syndromes.

Shi Jin, Fangming Ye, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2016

Accurate anomaly detection using correlation-based time-series analysis in a core router system.

Shi Jin, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu

Proceedings of the 2016 IEEE International Test Conference, 2016

2015

Information-Theoretic Syndrome Evaluation, Statistical Root-Cause Analysis, and Correlation-Based Feature Selection for Guiding Board-Level Fault Diagnosis.

Fangming Ye, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2015

Self-learning and adaptive board-level functional fault diagnosis.

Fangming Ye, Krishnendu Chakrabarty, Zhaobo Zhang, Xinli Gu

Proceedings of the 20th Asia and South Pacific Design Automation Conference, 2015

On test syndrome merging for reasoning-based board-level functional fault diagnosis.

Zelong Sun, Li Jiang, Qiang Xu, Zhaobo Zhang, Zhiyuan Wang, Xinli Gu

Proceedings of the 20th Asia and South Pacific Design Automation Conference, 2015

2014

Board-Level Functional Fault Diagnosis Using Multikernel Support Vector Machines and Incremental Learning.

Fangming Ye, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2014

Information-Theoretic Framework for Evaluating and Guiding Board-Level Functional-Fault Diagnosis.

Fangming Ye, Krishnendu Chakrabarty, Zhaobo Zhang, Xinli Gu

IEEE Des. Test, 2014

Special session 8B - Panel: In-field testing of SoC devices: Which solutions by which players?

Jacob A. Abraham, Xinli Gu, Teresa MacLaurin, Janusz Rajski, Paul G. Ryan, Dimitris Gizopoulos, Matteo Sonza Reorda

Proceedings of the 32nd IEEE VLSI Test Symposium, 2014

Knowledge discovery and knowledge transfer in board-level functional fault diagnosis.

Fangming Ye, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu

Proceedings of the 2014 International Test Conference, 2014

2013

Board-Level Functional Fault Diagnosis Using Artificial Neural Networks, Support-Vector Machines, and Weighted-Majority Voting.

Fangming Ye, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2013

AgentDiag: An agent-assisted diagnostic framework for board-level functional failures.

Zelong Sun, Li Jiang, Qiang Xu, Zhaobo Zhang, Zhiyuan Wang, Xinli Gu

Proceedings of the 2013 IEEE International Test Conference, 2013

Information-theoretic syndrome and root-cause analysis for guiding board-level fault diagnosis.

Fangming Ye, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu

Proceedings of the 18th IEEE European Test Symposium, 2013

Panel session what is the electronics industry doing to win the battle against the expected scary failure rates in future technology nodes?

Said Hamdioui, Davide Appello, Arnaud Grasset, Xinli Gu, Bram Kruseman, Riccardo Mariani, Hermann Obermeir, Srikanth Venkataraman

Proceedings of the 18th IEEE European Test Symposium, 2013

Handling Missing Syndromes in Board-Level Functional-Fault Diagnosis.

Fangming Ye, Shi Jin, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu

Proceedings of the 22nd Asian Test Symposium, 2013

2012

Physical-Defect Modeling and Optimization for Fault-Insertion Test.

Zhaobo Zhang, Zhanglei Wang, Xinli Gu, Krishnendu Chakrabarty

IEEE Trans. Very Large Scale Integr. Syst., 2012

Diagnosis of Board-Level Functional Failures Under Uncertainty Using Dempster-Shafer Theory.

Hongxia Fang, Krishnendu Chakrabarty, Zhiyuan Wang, Xinli Gu

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012

Reproduction and Detection of Board-Level Functional Failure.

Hongxia Fang, Krishnendu Chakrabarty, Zhiyuan Wang, Xinli Gu

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012

Are industrial test problems real problems? I thought research has resolved them all!

Xinli Gu

Proceedings of the 2012 IEEE International Test Conference, 2012

Diagnostic system based on support-vector machines for board-level functional diagnosis.

Zhaobo Zhang, Xinli Gu, Yaohui Xie, Zhiyuan Wang, Zhanglei Wang, Krishnendu Chakrabarty

Proceedings of the 17th IEEE European Test Symposium, 2012

Re-using chip level DFT at board level.

Xinli Gu, Jeff Rearick, Bill Eklow, Martin Keim, Jun Qian, Artur Jutman, Krishnendu Chakrabarty, Erik Larsson

Proceedings of the 17th IEEE European Test Symposium, 2012

Board-Level Functional Fault Diagnosis Using Learning Based on Incremental Support-Vector Machines.

Fangming Ye, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu

Proceedings of the 21st IEEE Asian Test Symposium, 2012

Adaptive Board-Level Functional Fault Diagnosis Using Decision Trees.

Fangming Ye, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu

Proceedings of the 21st IEEE Asian Test Symposium, 2012

In-Field Testing of NAND Flash Storage: Why and How?

Yu Hu, Xinli Gu, Xiaowei Li

Proceedings of the 21st IEEE Asian Test Symposium, 2012

Session Summary V: Is Component Interconnection Test Enough for Board or System Test.

Xinli Gu

Proceedings of the 21st IEEE Asian Test Symposium, 2012

Session Summary II: Dependable VLSI for Product Reliability.

Xinli Gu

Proceedings of the 21st IEEE Asian Test Symposium, 2012

2011

Smart diagnosis: Efficient board-level diagnosis and repair using artificial neural networks.

Zhaobo Zhang, Krishnendu Chakrabarty, Zhanglei Wang, Zhiyuan Wang, Xinli Gu

Proceedings of the 2011 IEEE International Test Conference, 2011

The gap: Test challenges in Asia manufacturing field.

Xinli Gu

Proceedings of the 2011 IEEE International Test Conference, 2011

Ranking of Suspect Faulty Blocks Using Dataflow Analysis and Dempster-Shafer Theory for the Diagnosis of Board-Level Functional Failures.

Hongxia Fang, Zhiyuan Wang, Xinli Gu, Krishnendu Chakrabarty

Proceedings of the 16th European Test Symposium, 2011

Deterministic test for the reproduction and detection of board-level functional failures.

Hongxia Fang, Zhiyuan Wang, Xinli Gu, Krishnendu Chakrabarty

Proceedings of the 16th Asia South Pacific Design Automation Conference, 2011

2010

Board-level fault diagnosis using Bayesian inference.

Zhaobo Zhang, Zhanglei Wang, Xinli Gu, Krishnendu Chakrabarty

Proceedings of the 28th IEEE VLSI Test Symposium, 2010

Board-level fault diagnosis using an error-flow dictionary.

Zhaobo Zhang, Zhanglei Wang, Xinli Gu, Krishnendu Chakrabarty

Proceedings of the 2011 IEEE International Test Conference, 2010

Optimization and Selection of Diagnosis-Oriented Fault-Insertion Points for System Test.

Zhaobo Zhang, Zhanglei Wang, Xinli Gu, Krishnendu Chakrabarty

Proceedings of the 19th IEEE Asian Test Symposium, 2010

Mimicking of Functional State Space with Structural Tests for the Diagnosis of Board-Level Functional Failures.

Hongxia Fang, Zhiyuan Wang, Xinli Gu, Krishnendu Chakrabarty

Proceedings of the 19th IEEE Asian Test Symposium, 2010

2009

Physical defect modeling for fault insertion in system reliability test.

Zhaobo Zhang, Zhanglei Wang, Xinli Gu, Krishnendu Chakrabarty

Proceedings of the 2009 IEEE International Test Conference, 2009

2008

VirtualScan: Test Compression Technology Using Combinational Logic and One-Pass ATPG.

Laung-Terng Wang, Xiaoqing Wen, Shianling Wu, Zhigang Wang, Zhigang Jiang, Boryau Sheu, Xinli Gu

IEEE Des. Test Comput., 2008

2006

Design for Board and System Level Structural Test and Diagnosis.

Toai Vo, Zhiyuan Wang, Ted Eaton, Pradipta Ghosh, Huai Li, Young Lee, Weili Wang, Hong Shin Jun, Rong Fang, Dan Singletary, Xinli Gu

Proceedings of the 2006 IEEE International Test Conference, 2006

2005

A practical perspective on reducing ASIC NTFs.

Zoe Conroy, Geoff Richmond, Xinli Gu, Bill Eklow

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

2004

At-Speed Interconnect Test and Diagnosis of External Memories on a System.

Heon C. Kim, Hong Shin Jun, Xinli Gu, Sung Soo Chung

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

Realizing High Test Quality Goals with Smart Test Resource Usage.

Xinli Gu, Cyndee Wang, Abby Lee, Bill Eklow, Kun-Han Tsai, Jan Arild Tofte, Mark Kassab, Janusz Rajski

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

2002

Re-Using DFT Logic for Functional and Silicon Debugging Test.

Xinli Gu, Weili Wang, Kevin Li, Heon C. Kim, Sung Soo Chung

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2001

An effort-minimized logic BIST implementation method.

Xinli Gu, Sung Soo Chung, Frank Tsang, Jan Arild Tofte, Hamid Rahmanian

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

1998

A new approach to scan chain reordering using physical design information.

Mokhtar Hirech, James Beausang, Xinli Gu

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

1997

A controller testability analysis and enhancement technique.

Xinli Gu, Erik Larsson, Krzysztof Kuchcinski, Zebo Peng

Proceedings of the European Design and Test Conference, 1997

1995

RT level testability-driven partitioning.

Xinli Gu

Proceedings of the 13th IEEE VLSI Test Symposium (VTS'95), April 30, 1995

An Efficient and Economic Partitioning Approach for Testability.

Xinli Gu, Krzysztof Kuchcinski, Zebo Peng

Proceedings of the Proceedings IEEE International Test Conference 1995, 1995

1994

Testability analysis and improvement from VHDL behavioral specifications.

Xinli Gu, Krzysztof Kuchcinski, Zebo Peng

Proceedings of the Proceedings EURO-DAC'94, 1994

1992

An approach to testability analysis and improvement for VLSI systems.

Xinli Gu, Krzysztof Kuchcinski, Zebo Peng

Microprocess. Microprogramming, 1992

1991

Testability measure with reconvergent fanout analysis and its applications.

Xinli Gu, Krzysztof Kuchcinski, Zebo Peng

Microprocessing and Microprogramming, 1991