Jean-Louis Carbonéro

According to our database, Jean-Louis Carbonéro authored at least 11 papers between 2005 and 2010.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2010

Fault Coverage on RF VCOs and BIST for Wafer Sort Using Peak-to-Peak Voltage Detectors.

Luca Testa, Hervé Lapuyade, Yann Deval, Jean-Louis Carbonéro, Jean-Baptiste Bégueret

J. Electron. Test., 2010

2009

BIST scheme for RF VCOs allowing the self-correction of the cut.

Luca Testa, Hervé Lapuyade, Yann Deval, Olivier Mazouffre, Jean-Louis Carbonéro, Jean-Baptiste Bégueret

Proceedings of the 2009 IEEE International Test Conference, 2009

2008

Choice of a High-Level Fault Model for the Optimization of Validation Test Set Reused for Manufacturing Test.

Yves Joannon, Vincent Beroulle, Chantal Robach, Smail Tedjini, Jean-Louis Carbonéro

VLSI Design, 2008

Decreasing Test Qualification Time in AMS and RF Systems.

Yves Joannon, Vincent Beroulle, Chantal Robach, Smail Tedjini, Jean-Louis Carbonéro

IEEE Des. Test Comput., 2008

2007

Qualification of behavioral level design validation for AMS & RF SoCs.

Yves Joannon, Vincent Beroulle, Chantal Robach, Smail Tedjini, Jean-Louis Carbonéro

Proceedings of the IFIP VLSI-SoC 2007, 2007

A stereo audio Σ∑ ADC architecture with embedded SNDR self-test.

Luís Rolíndez, Salvador Mir, Jean-Louis Carbonéro, Dimitri Goguet, Nabil Chouba

Proceedings of the 2007 IEEE International Test Conference, 2007

Interactive presentation: Evaluation of test measures for LNA production testing using a multinormal statistical model.

Jeanne Tongbong, Salvador Mir, Jean-Louis Carbonéro

Proceedings of the 2007 Design, Automation and Test in Europe Conference and Exposition, 2007

2006

A BIST Scheme for SNDR Testing of SigmaDelta ADCs Using Sine-Wave Fitting.

Luís Rolíndez, Salvador Mir, Ahcène Bounceur, Jean-Louis Carbonéro

J. Electron. Test., 2006

A SNDR BIST for Sigma-Delta Analogue-to-Digital Converters.

Luís Rolíndez, Salvador Mir, Ahcène Bounceur, Jean-Louis Carbonéro

Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006

Behavioral Modeling of WCDMA Transceiver with VHDL-AMS Language.

Yves Joannon, Vincent Beroulle, Rami Khouri, Chantal Robach, Smail Tedjini, Jean-Louis Carbonéro

Proceedings of the 9th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2006), 2006

2005

Optimising Test Sets for a Low Noise Amplifier with a Defect-Oriented Approach.

Rabeb Kheriji, V. Danelon, Jean-Louis Carbonéro, Salvador Mir

Proceedings of the 2005 Design, 2005