Jérémy Alvarez-Herault

According to our database, Jérémy Alvarez-Herault authored at least 8 papers between 2012 and 2018.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2018

An Automated Test Equipment for Characterization of Emerging MRAM and RRAM Arrays.

Alessandro Grossi, Cristian Zambelli, Piero Olivo, Paolo Pellati, Michele Ramponi, Christian Wenger, Jérémy Alvarez-Herault, Ken Mackay

IEEE Trans. Emerg. Top. Comput., 2018

2015

Reliability and cell-to-cell variability of TAS-MRAM arrays under cycling conditions.

Alessandro Grossi, Cristian Zambelli, Piero Olivo, Jérémy Alvarez-Herault, Ken Mackay

Proceedings of the 15th Non-Volatile Memory Technology Symposium, 2015

Automated characterization of TAS-MRAM test arrays.

Alessandro Grossi, Cristian Zambelli, Piero Olivo, Paolo Pellati, Michele Ramponi, Jérémy Alvarez-Herault, Ken Mackay

Proceedings of the 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2015

2014

A Complete Resistive-Open Defect Analysis for Thermally Assisted Switching MRAMs.

Joao Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, Jérémy Alvarez-Herault, Ken Mackay

IEEE Trans. Very Large Scale Integr. Syst., 2014

2013

Scalability and logic functionalities of TA-MRAMs.

Ioan Lucian Prejbeanu, Ricardo C. Sousa, Bernard Dieny, Jean-Pierre Nozieres, S. Bandiera, Jérémy Alvarez-Herault, Q. Stainer, L. Lombard, Clarisse Ducruet, Y. Conraux, Ken Mackay

Proceedings of the IEEE 11th International New Circuits and Systems Conference, 2013

2012

Coupling-based resistive-open defects in TAS-MRAM architectures.

Joao Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Guillaume Prenat, Jérémy Alvarez-Herault, Ken Mackay

Proceedings of the 17th IEEE European Test Symposium, 2012

Impact of resistive-open defects on the heat current of TAS-MRAM architectures.

Joao Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, Guillaume Prenat, Jérémy Alvarez-Herault, Ken Mackay

Proceedings of the 2012 Design, Automation & Test in Europe Conference & Exhibition, 2012

Impact of Resistive-Bridge Defects in TAS-MRAM Architectures.

Joao Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Guillaume Prenat, Jérémy Alvarez-Herault, Ken Mackay

Proceedings of the 21st IEEE Asian Test Symposium, 2012