Joao Azevedo

According to our database, Joao Azevedo authored at least 8 papers between 2012 and 2017.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2017

Content distribution emulation for vehicular networks.

Gonçalo Pessoa, Ricardo Dias, Tiago Condeixa, Joao Azevedo, Lucas Guardalben, Susana Sargento

Proceedings of the 2017 Wireless Days, Porto, Portugal, March 29-31, 2017, 2017

2016

Weather stations-assisted barometric altimeter for Android: Interpolation techniques for improved accuracy.

Joao Azevedo, Sérgio Crisóstomo

Proceedings of the IEEE Sensors Applications Symposium, 2016

2015

Distributed IP mobility in a real vehicular network.

Joao Azevedo, Tiago Condeixa, Susana Sargento

Proceedings of the IEEE International Conference on Communication, 2015

Session-less based thermal-aware 3D-SIC test scheduling.

Marie-Lise Flottes, Joao Azevedo, Giorgio Di Natale, Bruno Rouzeyre

Proceedings of the 20th IEEE European Test Symposium, 2015

2014

A Complete Resistive-Open Defect Analysis for Thermally Assisted Switching MRAMs.

Joao Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, Jérémy Alvarez-Herault, Ken Mackay

IEEE Trans. Very Large Scale Integr. Syst., 2014

2012

Coupling-based resistive-open defects in TAS-MRAM architectures.

Joao Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Guillaume Prenat, Jérémy Alvarez-Herault, Ken Mackay

Proceedings of the 17th IEEE European Test Symposium, 2012

Impact of resistive-open defects on the heat current of TAS-MRAM architectures.

Joao Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, Guillaume Prenat, Jérémy Alvarez-Herault, Ken Mackay

Proceedings of the 2012 Design, Automation & Test in Europe Conference & Exhibition, 2012

Impact of Resistive-Bridge Defects in TAS-MRAM Architectures.

Joao Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Guillaume Prenat, Jérémy Alvarez-Herault, Ken Mackay

Proceedings of the 21st IEEE Asian Test Symposium, 2012