Jiang-Lin Wei

Orcid: 0000-0002-2952-7282

According to our database1, Jiang-Lin Wei authored at least 19 papers between 2019 and 2023.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Bibliography

2023
Fine-Grained Alignment for Boundary Samples under Open Set Domain Adaptation.
Proceedings of the IEEE International Conference on Multimedia and Expo, 2023

Back to the Analog Neural Network and Linear Circuit Theory.
Proceedings of the 15th IEEE International Conference on ASIC, 2023

2022
IEEE754 Binary32 Floating-Point Logarithmic Algorithms Based on Taylor-Series Expansion with Mantissa Region Conversion and Division.
IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2022

Revisit to Histogram Method for ADC Linearity Test: Examination of Input Signal and Ratio of Input and Sampling Frequencies.
J. Electron. Test., 2022

VecLI: A framework for calculating vector landscape indices considering landscape fragmentation.
Environ. Model. Softw., 2022


2021
Floating-Point Inverse Square Root Algorithm Based on Taylor-Series Expansion.
IEEE Trans. Circuits Syst. II Express Briefs, 2021

Floating-Point Square Root Calculation Algorithm Based on Taylor-Series Expansion and Region Division.
Proceedings of the 64th IEEE International Midwest Symposium on Circuits and Systems, 2021

Revisit to Accurate ADC Testing with Incoherent Sampling Using Proper Sinusoidal Signal and Sampling Frequencies.
Proceedings of the IEEE International Test Conference, 2021

Summing Node and False Summing Node Methods: Accurate Operational Amplifier AC Characteristics Testing without Audio Analyzer.
Proceedings of the IEEE International Test Conference, 2021

Metallic Ratio Equivalent-Time Sampling: A Highly Efficient Waveform Acquisition Method.
Proceedings of the 27th IEEE International Symposium on On-Line Testing and Robust System Design, 2021

Evaluation of High-Precision Nano-Ampere Current Measurement Method for Mass Production.
Proceedings of the 28th IEEE International Conference on Electronics, 2021

High Precision Measurement of Sub-Nano Ampere Current in ATE Environment.
Proceedings of the 30th IEEE Asian Test Symposium, 2021

Divide and Conquer: Floating-Point Exponential Calculation Based on Taylor-Series Expansion.
Proceedings of the 14th IEEE International Conference on ASIC, 2021

Classical Mathematics and Analog/Mixed-Signal IC Design.
Proceedings of the 14th IEEE International Conference on ASIC, 2021

2020
Summing Node Test Method: Simultaneous Multiple AC Characteristics Testing of Multiple Operational Amplifiers.
Proceedings of the 29th IEEE Asian Test Symposium, 2020

Revisit to Floating-Point Division Algorithm Based on Taylor-Series Expansion.
Proceedings of the 2020 IEEE Asia Pacific Conference on Circuits and Systems, 2020

2019

High-Resolution Low-Sampling-Rate Δ∑ ADC Linearity Short-Time Testing Algorithm.
Proceedings of the 13th IEEE International Conference on ASIC, 2019


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