Jianghao Guo

According to our database, Jianghao Guo authored at least 7 papers between 2008 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2022

Analysis of the Development Trend of Artificial Intelligence Technology Application in the Field of Sports-Based on Patent Measurement.

Ti Hu, Jianghao Guo, Tao Zhang, Juncheng Liu, Xuezhang Sun, Zhaohe Chang

Proceedings of the Design, User Experience, and Usability: Design Thinking and Practice in Contemporary and Emerging Technologies, 2022

2015

On Resilient System Performance Binning.

Qiang Han, Jianghao Guo, Qiang Xu, Wen-Ben Jone

Proceedings of the 2015 Symposium on International Symposium on Physical Design, ISPD 2015, Monterey, CA, USA, March 29, 2015

2013

Path delay testing in resilient system.

Qiang Han, Jianghao Guo, Wen-Ben Jone, Qiang Xu

Proceedings of the IEEE 56th International Midwest Symposium on Circuits and Systems, 2013

A cross-layer fault-tolerant design method for high manufacturing yield and system reliability.

Jianghao Guo, Qiang Han, Wen-Ben Jone, Yu-Liang Wu

Proceedings of the 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2013

2010

Using Launch-on-Capture for Testing BIST Designs Containing Synchronous and Asynchronous Clock Domains.

Laung-Terng Wang, Xiaoqing Wen, Shianling Wu, Hiroshi Furukawa, Hao-Jan Chao, Boryau Sheu, Jianghao Guo, Wen-Ben Jone

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2010

2009

Turbo1500: Core-Based Design for Test and Diagnosis.

Laung-Terng Wang, Ravi Apte, Shianling Wu, Boryau Sheu, Wen-Ben Jone, Jianghao Guo, Kuen-Jong Lee, Wei-Shin Wang, Xiaoqing Wen, Hao-Jan Chao, Jinsong Liu, Yanlong Niu, Yi-Chih Sung, Chi-Chun Wang, Fangfang Li

IEEE Des. Test Comput., 2009

2008

Turbo1500: Toward Core-Based Design for Test and Diagnosis Using the IEEE 1500 Standard.

Laung-Terng Wang, Ravi Apte, Shianling Wu, Boryau Sheu, Kuen-Jong Lee, Xiaoqing Wen, Wen-Ben Jone, Chia-Hsien Yeh, Wei-Shin Wang, Hao-Jan Chao, Jianghao Guo, Jinsong Liu, Yanlong Niu, Yi-Chih Sung, Chi-Chun Wang, Fangfang Li

Proceedings of the 2008 IEEE International Test Conference, 2008