Jihan Standfest

According to our database, Jihan Standfest authored at least 4 papers between 2018 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2023

A Unified Aging Model Framework Capturing Device to Circuit Degradation for Advance Technology Nodes.

S. Mukhopadhyay, C. Chen, M. Jamil, Jihan Standfest, Inanc Meric, Balkaran Gill, Stephen Ramey

Proceedings of the IEEE International Reliability Physics Symposium, 2023

2022

Q&R On-Chip (QROC): A Unified, Oven-less and Scalable Circuit Reliability Platform.

Ketul B. Sutaria, Minki Cho, Anisur Rahman, Jihan Standfest, Rahul Sharma, Swaroop Kumar Namalapuri, Shiv Gupta, Bahar Ajdari, Ricardo Ascázubi, Balkaran Gill

Proceedings of the IEEE International Reliability Physics Symposium, 2022

2020

Novel Re-configurable Circuits For Aging Characterization: Connecting Devices to Circuits.

Ketul B. Sutaria, Jihan Standfest, Inanc Meric, Amirhossein H. Davoody, Swaroop Kumar Namalapuri, Trinadh Mutyala, Supriya P., Balkaran Gill, Stephen Ramey, Jeffery Hicks

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2018

Transistor reliability characterization and modeling of the 22FFL FinFET technology.

Chen-Yi Su, M. Armstrong, Lei Jiang, S. A. Kumar, C. D. Landon, S. Liu, Inanc Meric, K. W. Park, Leif Paulson, K. Phoa, Bernhard Sell, Jihan Standfest, Ketul B. Sutaria, J. Wan, D. Young, Stephen Ramey

Proceedings of the IEEE International Reliability Physics Symposium, 2018