Ketul Sutaria

According to our database, Ketul Sutaria authored at least 13 papers between 2012 and 2022.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2022

Q&R On-Chip (QROC): A Unified, Oven-less and Scalable Circuit Reliability Platform.

Ketul B. Sutaria, Minki Cho, Anisur Rahman, Jihan Standfest, Rahul Sharma, Swaroop Kumar Namalapuri, Shiv Gupta, Bahar Ajdari, Ricardo Ascázubi, Balkaran Gill

Proceedings of the IEEE International Reliability Physics Symposium, 2022

2020

Novel Re-configurable Circuits For Aging Characterization: Connecting Devices to Circuits.

Ketul B. Sutaria, Jihan Standfest, Inanc Meric, Amirhossein H. Davoody, Swaroop Kumar Namalapuri, Trinadh Mutyala, Supriya P., Balkaran Gill, Stephen Ramey, Jeffery Hicks

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2018

Transistor reliability characterization and modeling of the 22FFL FinFET technology.

Chen-Yi Su, M. Armstrong, Lei Jiang, S. A. Kumar, C. D. Landon, S. Liu, Inanc Meric, K. W. Park, Leif Paulson, K. Phoa, Bernhard Sell, Jihan Standfest, Ketul B. Sutaria, J. Wan, D. Young, Stephen Ramey

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2017

RTN in Scaled Transistors for On-Chip Random Seed Generation.

Abinash Mohanty, Ketul B. Sutaria, Hiromitsu Awano, Takashi Sato, Yu Cao

IEEE Trans. Very Large Scale Integr. Syst., 2017

2015

Duty cycle shift under static/dynamic aging in 28nm HK-MG technology.

Ketul B. Sutaria, Pengpeng Ren, Abinash Mohanty, Xixiang Feng, Runsheng Wang, Ru Huang, Yu Cao

Proceedings of the IEEE International Reliability Physics Symposium, 2015

2014

Cross-Layer Modeling and Simulation of Circuit Reliability.

Yu Cao, Jyothi Velamala, Ketul Sutaria, Mike Shuo-Wei Chen, Jonathan Ahlbin, Ivan Sanchez Esqueda, Michael Bajura, Michael Fritze

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2014

Where is the Achilles Heel under Circuit Aging.

Ketul Sutaria, Athul Ramkumar, Rongjun Zhu, Yu Cao

Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2014

BTI-Induced Aging under Random Stress Waveforms: Modeling, Simulation and Silicon Validation.

Ketul Sutaria, Athul Ramkumar, Rongjun Zhu, Renju Rajveev, Yao Ma, Yu Cao

Proceedings of the 51st Annual Design Automation Conference 2014, 2014

2013

Compact modeling of STT-MTJ for SPICE simulation.

Zihan Xu, Ketul Sutaria, Chengen Yang, Chaitali Chakrabarti, Yu Cao

Proceedings of the European Solid-State Device Research Conference, 2013

2012

Enhancing the Reliability of STT-RAM through Circuit and System Level Techniques.

Yunus Emre, Chengen Yang, Ketul Sutaria, Yu Cao, Chaitali Chakrabarti

Proceedings of the 2012 IEEE Workshop on Signal Processing Systems, 2012

Hierarchical modeling of Phase Change memory for reliable design.

Zihan Xu, Ketul Sutaria, Chengen Yang, Chaitali Chakrabarti, Yu Cao

Proceedings of the 30th International IEEE Conference on Computer Design, 2012

Physics matters: statistical aging prediction under trapping/detrapping.

Jyothi Bhaskarr Velamala, Ketul Sutaria, Takashi Sato, Yu Cao

Proceedings of the 49th Annual Design Automation Conference 2012, 2012

Statistical aging under dynamic voltage scaling: A logarithmic model approach.

Jyothi Velamala, Ketul Sutaria, Hirofumi Shimizu, Hiromitsu Awano, Takashi Sato, Yu Cao

Proceedings of the IEEE 2012 Custom Integrated Circuits Conference, 2012