John C. Potter

According to our database, John C. Potter authored at least 10 papers between 1999 and 2016.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2016

Using Existing Reconfigurable Logic in 3D Die Stacks for Test.

Fanchen Zhang, Yi Sun, Xi Shen, Kundan Nepal, Jennifer Dworak, Theodore W. Manikas, Ping Gui, R. Iris Bahar, Al Crouch, John C. Potter

Proceedings of the 25th IEEE North Atlantic Test Workshop, 2016

Invited - A box of dots: using scan-based path delay test for timing verification.

Alfred L. Crouch, John C. Potter

Proceedings of the 53rd Annual Design Automation Conference, 2016

2014

Board security enhancement using new locking SIB-based architectures.

Jennifer Dworak, Zoe Conroy, Alfred L. Crouch, John C. Potter

Proceedings of the 2014 International Test Conference, 2014

Making it harder to unlock an LSIB: Honeytraps and misdirection in a P1687 network.

Adam Zygmontowicz, Jennifer Dworak, Al Crouch, John C. Potter

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014

2013

FPGA-Based Embedded Tester with a P1687 Command, Control, and Observe-System.

Alfred L. Crouch, John C. Potter, Ajay Khoche, Jennifer Dworak

IEEE Des. Test, 2013

Don't forget to lock your SIB: Hiding instruments using P16871.

Jennifer Dworak, Al Crouch, John C. Potter, Adam Zygmontowicz, Micah Thornton

Proceedings of the 2013 IEEE International Test Conference, 2013

2003

AC Scan Path Selection for Physical Debugging.

Alfred L. Crouch, John C. Potter, Jason Doege

IEEE Des. Test Comput., 2003

2000

Test Development for a Third-Version ColdFire Microprocessor.

Alfred L. Crouch, Michael Mateja, Teresa L. McLaurin, John C. Potter, Dat Tran

IEEE Des. Test Comput., 2000

On-the-shelf core pattern methodology for ColdFire(R) microprocessor cores.

Teresa L. McLaurin, John C. Potter

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

1999

The testability features of the 3rd generation ColdFire family of microprocessors.

Alfred L. Crouch, Michael Mateja, Teresa L. McLaurin, John C. Potter, Dat Tran

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999