Teresa L. McLaurin

According to our database, Teresa L. McLaurin authored at least 22 papers between 1999 and 2022.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2022

Applying IEEE Test Standards to Multidie Designs.

Teresa McLaurin, Adam Cron

IEEE Des. Test, 2022

2021

Applying IEEE Std 1838 to the 3DIC Design Trishul - A Case Study.

Teresa L. McLaurin, Frank Frederick, Heath Perry, Shawn Hung, Saurabh Sinha

Proceedings of the 26th IEEE European Test Symposium, 2021

2019

The Challenges of Implementing an MBIST Interface: A Practical Application.

Teresa McLaurin, Rob Knoth

Proceedings of the IEEE International Test Conference, 2019

2018

Improving Power, Performance and Area with Test: A Case Study.

Teresa L. McLaurin, Ignatius P. Lawrence

Proceedings of the IEEE International Test Conference, 2018

Periodic Online LBIST Considerations for a Multicore Processor.

Teresa L. McLaurin

Proceedings of the IEEE International Test Conference in Asia, 2018

2016

IEEE Std P1838: DfT standard-under-development for 2.5D-, 3D-, and 5.5D-SICs.

Erik Jan Marinissen, Teresa L. McLaurin, Hailong Jiao

Proceedings of the 21th IEEE European Test Symposium, 2016

2013

Creating Structural Patterns for At-Speed Testing: A Case Study.

Teresa L. McLaurin

IEEE Des. Test, 2013

2012

The DFT challenges and solutions for the ARM® Cortex™-A15 Microprocessor.

Teresa L. McLaurin, Frank Frederick, Rich Slobodnik

Proceedings of the 2012 IEEE International Test Conference, 2012

2009

The ARM Cortex-A8 Microprocessor IEEE Std 1500 Wrapper.

Teresa L. McLaurin, Stylianos Diamantidis, Irakis Diamantidis

IEEE Des. Test Comput., 2009

2007

Enhanced testing of clock faults.

Teresa L. McLaurin, Rich Slobodnik, Kun-Han Tsai, Ana Keim

Proceedings of the 2007 IEEE International Test Conference, 2007

Design for test features of the ARM clock control macro.

Frank Frederick, Teresa L. McLaurin

Proceedings of the 2007 IEEE International Test Conference, 2007

2006

The Challenge of Testing the ARM CORTEX-A8^TM Microprocessor Core.

Teresa L. McLaurin

Proceedings of the 2006 IEEE International Test Conference, 2006

2005

A methodology for testing one-hot transmission gate multiplexers.

Teresa L. McLaurin, Frank Frederick, Rich Slobodnik

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

2003

The Testability Features of The ARM1026EJ Microprocessor Core.

Teresa L. McLaurin, Frank Frederick, Rich Slobodnik

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002

On IEEE P1500's Standard for Embedded Core Test.

Erik Jan Marinissen, Rohit Kapur, Maurice Lousberg, Teresa L. McLaurin, Mike Ricchetti, Yervant Zorian

J. Electron. Test., 2002

ETM10 Incorporates Hardware Segment of IEEE P1500.

Teresa L. McLaurin, Souvik Ghosh

IEEE Des. Test Comput., 2002

TAPS All Over My Chips.

Teresa L. McLaurin

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2001

IP and Automation to Support IEEE P1500.

Dwayne Burek, Garen Darbinyan, Rohit Kapur, Maurice Lousberg, Teresa L. McLaurin, Mike Ricchetti

Proceedings of the 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April, 2001

2000

Test Development for a Third-Version ColdFire Microprocessor.

Alfred L. Crouch, Michael Mateja, Teresa L. McLaurin, John C. Potter, Dat Tran

IEEE Des. Test Comput., 2000

On-the-shelf core pattern methodology for ColdFire(R) microprocessor cores.

Teresa L. McLaurin, John C. Potter

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

The testability features of the MCF5407 containing the 4th generation ColdFire(R) microprocessor core.

Teresa L. McLaurin, Frank Frederick

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

1999

The testability features of the 3rd generation ColdFire family of microprocessors.

Alfred L. Crouch, Michael Mateja, Teresa L. McLaurin, John C. Potter, Dat Tran

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999