Michael Mateja

According to our database, Michael Mateja authored at least 13 papers between 1997 and 2012.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2012

Scan-Based Speed-Path Debug for a Microprocessor.

Jing Zeng, Ruifeng Guo, Wu-Tung Cheng, Michael Mateja, Jing Wang

IEEE Des. Test Comput., 2012

2010

Selecting the most relevant structural Fmax for system Fmax correlation.

Janine Chen, Jing Zeng, Li-C. Wang, Jeff Rearick, Michael Mateja

Proceedings of the 28th IEEE VLSI Test Symposium, 2010

Mining AC delay measurements for understanding speed-limiting paths.

Janine Chen, Brendon Bolin, Li-C. Wang, Jing Zeng, Dragoljub Gagi Drmanac, Michael Mateja

Proceedings of the 2011 IEEE International Test Conference, 2010

On evaluating speed path detection of structural tests.

Jing Zeng, Jing Wang, Chia-Ying Chen, Michael Mateja, Li-C. Wang

Proceedings of the 11th International Symposium on Quality of Electronic Design (ISQED 2010), 2010

Scan based speed-path debug for a microprocessor.

Jing Zeng, Ruifeng Guo, Wu-Tung Cheng, Michael Mateja, Jing Wang, Kun-Han Tsai, Ken Amstutz

Proceedings of the 15th European Test Symposium, 2010

Correlating system test Fmax with structural test Fmax and process monitoring measurements.

Janine Chen, Jing Zeng, Li-C. Wang, Michael Mateja

Proceedings of the 15th Asia South Pacific Design Automation Conference, 2010

2009

A Path-Oriented Timing-Aware Diagnosis Methodology of At-Speed Transition Tests.

Jing Zeng, Jing Wang, Michael Mateja

Proceedings of the 10th International Workshop on Microprocessor Test and Verification, 2009

Data learning techniques and methodology for Fmax prediction.

Janine Chen, Li-C. Wang, Po-Hsien Chang, Jing Zeng, S. Yu, Michael Mateja

Proceedings of the 2009 IEEE International Test Conference, 2009

2008

The Test Features of the Quad-Core AMD Opteron- Microprocessor.

Tim Wood, Grady Giles, Chris Kiszely, Martin Schuessler, Daniela Toneva, Joel Irby, Michael Mateja

Proceedings of the 2008 IEEE International Test Conference, 2008

2000

Test Development for a Third-Version ColdFire Microprocessor.

Alfred L. Crouch, Michael Mateja, Teresa L. McLaurin, John C. Potter, Dat Tran

IEEE Des. Test Comput., 2000

1999

The testability features of the 3rd generation ColdFire family of microprocessors.

Alfred L. Crouch, Michael Mateja, Teresa L. McLaurin, John C. Potter, Dat Tran

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

1998

Test Development for Second-Generation ColdFire Microprocessors.

Dale Amason, Alfred L. Crouch, Renny Eisele, Grady Giles, Michael Mateja

IEEE Des. Test Comput., 1998

1997

A Case Study of the Test Development for the 2nd Generation ColdFire® Microprocessors.

Michael Mateja, Alfred L. Crouch, Renny Eisele, Grady Giles, Dale Amason

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997