Julie Laguerre

According to our database, Julie Laguerre authored at least 6 papers between 2023 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

Scalable Design Techniques for Expanding Ferroelectric-Based Non-volatile SRAMs Applications.

Lucas Rhetat, Jean-Philippe Noel, Bastien Giraud, Laurent Grenouillet, Julie Laguerre, Cédric Marchand, Ian O'Connor

Proceedings of the VLSI-SoC: Technology Advancement on SoC Design - 32nd IFIP/IEEE International Conference on Very Large Scale Integration, 2024

A Novel Design Technique for Enhanced Security and New Applications of Ferroelectric-Based Non-Volatile SRAM.

Lucas Rhetat, Jean-Philippe Noel, Bastien Giraud, Laurent Grenouillet, Julie Laguerre, Cédric Marchand, Ian O'Connor

Proceedings of the 32nd IFIP/IEEE International Conference on Very Large Scale Integration, 2024

Data Retention Insights from Joint Analysis on BEOL-Integrated HZO-Based Scaled FeCAPs and 16kbit 1T-1C FeRAM Arrays.

J. Laguerre, Simon Martin, Jean Coignus, Catherine Carabasse, Marc Bocquet, François Andrieu, Laurent Grenouillet

Proceedings of the IEEE International Reliability Physics Symposium, 2024

Charge-based Sense Demonstration in 1T-1C HZO FeRAM Arrays to Overcome CBL-induced Bank Size Limitations.

Olivier Billoint, Simon Martin, J. Laguerre, L. Hosier, Jean Coignus, Catherine Carabasse, François Andrieu, Laurent Grenouillet

Proceedings of the IEEE International Memory Workshop, 2024

2023

Reliability assessment of hafnia-based ferroelectric devices and arrays for memory and AI applications (Invited).

Laurent Grenouillet, Justine Barbot, J. Laguerre, Simon Martin, Catherine Carabasse, M. Louro, Messaoud Bedjaoui, S. Minoret, S. Kerdilès, C. Boixaderas, Thomas Magis, Carine Jahan, François Andrieu, Jean Coignus

Proceedings of the IEEE International Reliability Physics Symposium, 2023

Memory Window in Si: HfO2 FeRAM arrays: Performance Improvement and Extrapolation at Advanced Nodes.

J. Laguerre, Marc Bocquet, Olivier Billoint, Simon Martin, Jean Coignus, Catherine Carabasse, Thomas Magis, T. Dewolf, François Andrieu, Laurent Grenouillet

Proceedings of the IEEE International Memory Workshop, 2023