Kees Veelenturf
According to our database1,
Kees Veelenturf
authored at least 3 papers
between 1998 and 2000.
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Bibliography
2000
Proceedings of the 2000 Design, 2000
1998
Semiconductor manufacturing process monitoring using built-in self-test for embedded memories.
Proceedings of the Proceedings IEEE International Test Conference 1998, 1998