Peter Muhmenthaler

According to our database1, Peter Muhmenthaler authored at least 11 papers between 1991 and 2006.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
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Links

On csauthors.net:

Bibliography

2006
Session Abstract.
Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006

New on-Chip DFT and ATE Features for Efficient Embedded Memory Test.
Proceedings of the 14th IEEE International Workshop on Memory Technology, 2006

2005
Compression mode diagnosis enables high volume monitoring diagnosis flow.
Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

2004
Diagnosis of Scan-Chains by Use of a Configurable Signature Register and Error-Correcting Code.
Proceedings of the 2004 Design, 2004

2003
Industrial Experience with Adoption of EDT for Low-Cost Test without Concessions.
Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002
Outsourcing Test without Standards?
Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2001
Embedded tutorial: TRP: integrating embedded test and ATE.
Proceedings of the Conference on Design, Automation and Test in Europe, 2001

2000

1999
Cost effective testing of systems on silicon: areas for optimization.
Proceedings of the 4th European Test Workshop, 1999

1991
Enhanced fault modeling for DRAM test and analysis.
Proceedings of the 9th IEEE VLSI Test Symposium (VTS'91), 1991

Test Pattern Development and Evaluation for DRAMs with Fault Simulator RAMSIM.
Proceedings of the Proceedings IEEE International Test Conference 1991, 1991


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