Lin Wang

Orcid: 0000-0003-3430-7345

According to our database1, Lin Wang authored at least 2 papers between 2024 and 2025.

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Bibliography

2025
Device-Aware Test for Anomalous Charge Trapping in FeFETs.
Proceedings of the 30th Asia and South Pacific Design Automation Conference, 2025

2024
Defects, Fault Modeling, and Test Development Framework for FeFETs.
Proceedings of the IEEE International Test Conference, 2024


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