Artur Pogiel

According to our database, Artur Pogiel authored at least 20 papers between 2004 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2022

LBIST for Automotive ICs With Enhanced Test Generation.

Bartosz Kaczmarek, Grzegorz Mrugalski, Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Lukasz Rybak, Jerzy Tyszer

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022

2021

Convolutional Compaction-Based MRAM Fault Diagnosis.

Bartosz Grzelak, Martin Keim, Artur Pogiel, Janusz Rajski, Jerzy Tyszer

Proceedings of the 26th IEEE European Test Symposium, 2021

2017

ROM fault diagnosis for O(n²) test algorithms.

Artur Pogiel, Janusz Rajski, Jerzy Tyszer

Proceedings of the 22nd IEEE European Test Symposium, 2017

2014

Quality assurance in memory built-in self-test tools.

Albert Au, Artur Pogiel, Janusz Rajski, Piotr Sydow, Jerzy Tyszer, Justyna Zawada

Proceedings of the 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2014

High-Speed Serial Embedded Deterministic Test for System-on-Chip Designs.

Maciej Trawka, Grzegorz Mrugalski, Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Jakub Janicki, Jerzy Tyszer

Proceedings of the 23rd IEEE Asian Test Symposium, 2014

2011

BIST-Based Fault Diagnosis for Read-Only Memories.

Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Jerzy Tyszer

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2011

Fault Diagnosis with Orthogonal Compactors in Scan-Based Designs.

Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer

J. Electron. Test., 2011

Ring Generator: An Ultimate Linear Feedback Shift Register.

Nilanjan Mukherjee, Janusz Rajski, Grzegorz Mrugalski, Artur Pogiel, Jerzy Tyszer

Computer, 2011

Fault Diagnosis in Memory BIST Environment with Non-march Tests.

Grzegorz Mrugalski, Artur Pogiel, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer, Pawel Urbanek

Proceedings of the 20th IEEE Asian Test Symposium, 2011

2010

High Volume Diagnosis in Memory BIST Based on Compressed Failure Data.

Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Jerzy Tyszer

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2010

Diagnosis of failing scan cells through orthogonal response compaction.

Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer

Proceedings of the 15th European Test Symposium, 2010

2009

High-Speed On-Chip Event Counters for Embedded Systems.

Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Jerzy Tyszer

Proceedings of the VLSI Design 2009: Improving Productivity through Higher Abstraction, 2009

Fault diagnosis for embedded read-only memories.

Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Jerzy Tyszer

Proceedings of the 2009 IEEE International Test Conference, 2009

2008

High Throughput Diagnosis via Compression of Failure Data in Embedded Memory BIST.

Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Jerzy Tyszer

Proceedings of the 2008 IEEE International Test Conference, 2008

2007

Fault Diagnosis With Convolutional Compactors.

Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jerzy Tyszer

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2007

Isolation of Failing Scan Cells through Convolutional Test Response Compaction.

Grzegorz Mrugalski, Janusz Rajski, Chen Wang, Artur Pogiel, Jerzy Tyszer

J. Electron. Test., 2007

2006

Convolutional Compactors with Variable Polynomials.

Artur Pogiel, Janusz Rajski, Jerzy Tyszer

Proceedings of the 11th European Test Symposium, 2006

2005

Diagnosis with convolutional compactors in presence of unknown states.

Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jerzy Tyszer

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

Convolutional compaction-driven diagnosis of scan failures.

Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jerzy Tyszer, Chen Wang

Proceedings of the 10th European Test Symposium, 2005

2004

Fault Diagnosis in Designs with Convolutional Compactors.

Grzegorz Mrugalski, Chen Wang, Artur Pogiel, Jerzy Tyszer, Janusz Rajski

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004