M. Arabi

According to our database1, M. Arabi authored at least 5 papers between 2018 and 2022.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Links

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Bibliography

2022
Frequency dependant gate oxide TDDB model.
Proceedings of the IEEE International Reliability Physics Symposium, 2022

2018
AC TDDB extensive study for an enlargement of its impact and benefit on circuit lifetime assessment.
Proceedings of the IEEE International Reliability Physics Symposium, 2018

Key parameters driving transistor degradation in advanced strained SiGe channels.
Proceedings of the IEEE International Reliability Physics Symposium, 2018

Modeling self-heating effects in advanced CMOS nodes.
Proceedings of the IEEE International Reliability Physics Symposium, 2018

Integrated Test Structures for Reliability Investigation under Dynamic Stimuli.
Proceedings of the 24th IEEE International Symposium on On-Line Testing And Robust System Design, 2018


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