S. Mahapatra

This page is a disambiguation page, it actually contains mutiple papers from persons of the same or a similar name.

Bibliography

2018

Key parameters driving transistor degradation in advanced strained SiGe channels.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Reliability Physics Symposium, 2018

Epitaxial Gd2O3on Si (111) Substrate by Sputtering to Enable Low Cost SOI.

[BibT_eX]

[DOI]

Proceedings of the 76th Device Research Conference, 2018

2015

Impact of time-zero and NBTI variability on sub-20nm FinFET based SRAM at low voltages.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Reliability Physics Symposium, 2015

2007

A comprehensive model for PMOS NBTI degradation: Recent progress.

[BibT_eX]

[DOI]

Muhammad Ashraful Alam

Haldun Kufluoglu

Dhanoop Varghese

S. Mahapatra

Microelectron. Reliab., 2007

Analysis of an optical packet switch with partially shared buffer and wavelength conversion.

[BibT_eX]

[DOI]

Sandip Debnath

S. Mahapatra

Ranjan Gangopadhyay

IET Commun., 2007

2006

The Jahn-Teller and pseudo-Jahn-Teller effects in the anion photoelectron spectroscopy of B3 cluster.

[BibT_eX]

[DOI]

T. S. Venkatesan

K. Deepika

S. Mahapatra

J. Comput. Chem., 2006

2005

A comprehensive model of PMOS NBTI degradation.

[BibT_eX]

[DOI]

Muhammad Ashraful Alam

S. Mahapatra

Microelectron. Reliab., 2005

2003

Substrate Bias Effect on Cycling Induced Performance Degradation of Flash EEPROMs.

[BibT_eX]

[DOI]

S. Mahapatra

S. Shukuri

Jeff Bude

Proceedings of the 16th International Conference on VLSI Design (VLSI Design 2003), 2003

2001

Multi-frequency transconductance technique for interface characterization of deep sub-micron SOI-MOSFETs.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2001

erformance Optimization Of 60 Nm Channel Length Vertical Mosfets Using Channel Engineering.

[BibT_eX]

[DOI]

Proceedings of the 14th International Conference on VLSI Design (VLSI Design 2001), 2001

S. Mahapatra

Bibliography

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