Markus Seuring

According to our database, Markus Seuring authored at least 11 papers between 1998 and 2012.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

2012

Employing the STDF V4-2007 Standard for Scan Test Data Logging.

Markus Seuring, Michael Braun, Alan Ma, Geir Eide, Kathy Yang, Huaxing Tang

IEEE Des. Test, 2012

2006

Combining Scan Test and Built-in Self Test.

Markus Seuring

J. Electron. Test., 2006

2003

Multimode scan: Test per clock BIST for IP cores.

Adit D. Singh, Markus Seuring, Michael Gössel, Egor S. Sogomonyan

ACM Trans. Design Autom. Electr. Syst., 2003

Space compaction of test responses using orthogonal transmission functions [logic testing].

Krishnendu Chakrabarty, Markus Seuring

IEEE Trans. Instrum. Meas., 2003

2000

Output space compaction for testing and concurrent checking.

Markus Seuring

PhD thesis, 2000

Space Compaction of Test Responses for IP Cores Using Orthogonal Transmission Functions.

Markus Seuring, Krishnendu Chakrabarty

Proceedings of the 18th IEEE VLSI Test Symposium (VTS 2000), 30 April, 2000

Low Cost Concurrent Error Detection Based on Modulo Weight-Based Codes.

Debaleena Das, Nur A. Touba, Markus Seuring, Michael Gössel

Proceedings of the 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 2000

1999

A Structural Method for Output Compaction of Sequential Automata Implemented as Circuits.

Markus Seuring, Michael Gössel

Proceedings of the Automata Implementation, 1999

Testability evaluation of sequential designs incorporating the multi-mode scannable memory element.

Adit D. Singh, Egor S. Sogomonyan, Michael Gössel, Markus Seuring

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

A Structural Approach for Space Compaction for Sequential Circuits.

Markus Seuring, Michael Gössel

Proceedings of the 14th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT '99), 1999

1998

A Structural Approach for Space Compaction for Concurrent Checking and BIST.

Markus Seuring, Michael Gössel, Egor S. Sogomonyan

Proceedings of the 16th IEEE VLSI Test Symposium (VTS '98), 28 April, 1998