Melanie Elm

According to our database, Melanie Elm authored at least 10 papers between 2008 and 2012.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2012

Accurate X-Propagation for Test Applications by SAT-Based Reasoning.

Michael A. Kochte, Melanie Elm, Hans-Joachim Wunderlich

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012

Structural Test and Diagnosis for Graceful Degradation of NoC Switches.

Atefe Dalirsani, Stefan Holst, Melanie Elm, Hans-Joachim Wunderlich

J. Electron. Test., 2012

Reuse of Structural Volume Test Methods for In-System Testing of Automotive ASICs.

Alejandro Cook, Dominik Ull, Melanie Elm, Hans-Joachim Wunderlich, Helmut Randoll, Stefan Dohren

Proceedings of the 21st IEEE Asian Test Symposium, 2012

2011

Structural Test for Graceful Degradation of NoC Switches.

Atefe Dalirsani, Stefan Holst, Melanie Elm, Hans-Joachim Wunderlich

Proceedings of the 16th European Test Symposium, 2011

Structural In-Field Diagnosis for Random Logic Circuits.

Alejandro Cook, Melanie Elm, Hans-Joachim Wunderlich, Ulrich Abelein

Proceedings of the 16th European Test Symposium, 2011

2010

BISD: Scan-based Built-In self-diagnosis.

Melanie Elm, Hans-Joachim Wunderlich

Proceedings of the Design, Automation and Test in Europe, 2010

On Determining the Real Output Xs by SAT-Based Reasoning.

Melanie Elm, Michael A. Kochte, Hans-Joachim Wunderlich

Proceedings of the 19th IEEE Asian Test Symposium, 2010

2009

Test Encoding for Extreme Response Compaction.

Michael A. Kochte, Stefan Holst, Melanie Elm, Hans-Joachim Wunderlich

Proceedings of the 14th IEEE European Test Symposium, 2009

2008

Scan Chain Organization for Embedded Diagnosis.

Melanie Elm, Hans-Joachim Wunderlich

Proceedings of the Design, Automation and Test in Europe, 2008

Scan chain clustering for test power reduction.

Melanie Elm, Hans-Joachim Wunderlich, Michael E. Imhof, Christian G. Zoellin, Jens Leenstra, Nicolas Mäding

Proceedings of the 45th Design Automation Conference, 2008