Christian G. Zoellin

According to our database, Christian G. Zoellin authored at least 23 papers between 2005 and 2021.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2021

Energy Efficiency Boost in the AI-Infused POWER10 Processor.

Brian W. Thompto, Dung Q. Nguyen, José E. Moreira, Ramon Bertran, Hans M. Jacobson, Richard J. Eickemeyer, Rahul M. Rao, Michael Goulet, Marcy Byers, Christopher J. Gonzalez, Karthik Swaminathan, Nagu R. Dhanwada, Silvia M. Müller, Andreas Wagner, Satish Kumar Sadasivam, Robert K. Montoye, William J. Starke, Christian G. Zoellin, Michael S. Floyd, Jeffrey Stuecheli, Nandhini Chandramoorthy, John-David Wellman, Alper Buyuktosunoglu, Matthias Pflanz, Balaram Sinharoy, Pradip Bose

Proceedings of the 48th ACM/IEEE Annual International Symposium on Computer Architecture, 2021

2018

New database compression assists in the IBM z14 processor.

Christian G. Zoellin, Oliver Draese, Jonathan D. Bradbury, Christian Jacobi, Aditya Puranik, Peter Sutton, Robert Tokumaru

IBM J. Res. Dev., 2018

Enabling pervasive encryption through IBM Z stack innovations.

Michael Jordan, Nicholas P. Sardino, Meghan McGrath, Christian G. Zoellin, Thomas E. Morris, Cecilia Carranza Lewis, Greg Vance, Bruce Naylor, Jim Pickel, M. Sueli Almeida, Dave Wierbowski, Chris Meyer, Reinhard Bündgen, Michael Zagorski, Hans Schoone, Kathryn Voss

IBM J. Res. Dev., 2018

IBM z14™: 14nm microprocessor for the next-generation mainframe.

Christopher J. Berry, James D. Warnock, John Isakson, John Badar, Brian Bell, Frank Malgioglio, Guenter Mayer, Dina Hamid, Jesse Surprise, David Wolpert, Ofer Geva, Bill Huott, Leon J. Sigal, Sean M. Carey, Richard F. Rizzolo, Ricardo Nigaglioni, Mark Cichanowski, Dureseti Chidambarrao, Christian Jacobi, Anthony Saporito, Arthur O'neill, Robert J. Sonnelitter, Christian G. Zoellin, Michael H. Wood, José Neves

Proceedings of the 2018 IEEE International Solid-State Circuits Conference, 2018

2017

Static netlist verification for IBM high-frequency processors using a tree-grammar.

Christoph Jäschke, Ulla Herter, Claudia Wolkober, Carsten Schmitt, Christian G. Zoellin

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2017

2015

Test planning for low-power built-in self test.

Christian G. Zöllin

PhD thesis, 2015

2011

Efficient multi-level fault simulation of HW/SW systems for structural faults.

Rafal Baranowski, Stefano Di Carlo, Nadereh Hatami, Michael E. Imhof, Michael A. Kochte, Paolo Prinetto, Hans-Joachim Wunderlich, Christian G. Zoellin

Sci. China Inf. Sci., 2011

2010

Efficient Concurrent Self-Test with Partially Specified Patterns.

Michael A. Kochte, Christian G. Zoellin, Hans-Joachim Wunderlich

J. Electron. Test., 2010

Low-power test planning for arbitrary at-speed delay-test clock schemes.

Christian G. Zoellin, Hans-Joachim Wunderlich

Proceedings of the 28th IEEE VLSI Test Symposium, 2010

System reliability evaluation using concurrent multi-level simulation of structural faults.

Michael A. Kochte, Christian G. Zoellin, Rafal Baranowski, Michael E. Imhof, Hans-Joachim Wunderlich, Nadereh Hatami, Stefano Di Carlo, Paolo Prinetto

Proceedings of the 2011 IEEE International Test Conference, 2010

Efficient fault simulation on many-core processors.

Michael A. Kochte, Marcel Schaal, Hans-Joachim Wunderlich, Christian G. Zoellin

Proceedings of the 47th Design Automation Conference, 2010

Efficient Simulation of Structural Faults for the Reliability Evaluation at System-Level.

Michael A. Kochte, Christian G. Zoellin, Rafal Baranowski, Michael E. Imhof, Hans-Joachim Wunderlich, Nadereh Hatami, Stefano Di Carlo, Paolo Prinetto

Proceedings of the 19th IEEE Asian Test Symposium, 2010

2009

Concurrent Self-Test with Partially Specified Patterns for Low Test Latency and Overhead.

Michael A. Kochte, Christian G. Zoellin, Hans-Joachim Wunderlich

Proceedings of the 14th IEEE European Test Symposium, 2009

Test exploration and validation using transaction level models.

Michael A. Kochte, Christian G. Zoellin, Michael E. Imhof, Rauf Salimi Khaligh, Martin Radetzki, Hans-Joachim Wunderlich, Stefano Di Carlo, Paolo Prinetto

Proceedings of the Design, Automation and Test in Europe, 2009

2008

Integrating Scan Design and Soft Error Correction in Low-Power Applications.

Michael E. Imhof, Hans-Joachim Wunderlich, Christian G. Zoellin

Proceedings of the 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 2008

Selective Hardening in Early Design Steps.

Christian G. Zoellin, Hans-Joachim Wunderlich, Ilia Polian, Bernd Becker

Proceedings of the 13th European Test Symposium, 2008

Test Set Stripping Limiting the Maximum Number of Specified Bits.

Michael A. Kochte, Christian G. Zoellin, Michael E. Imhof, Hans-Joachim Wunderlich

Proceedings of the 4th IEEE International Symposium on Electronic Design, 2008

Scan chain clustering for test power reduction.

Melanie Elm, Hans-Joachim Wunderlich, Michael E. Imhof, Christian G. Zoellin, Jens Leenstra, Nicolas Mäding

Proceedings of the 45th Design Automation Conference, 2008

2007

Programmable deterministic Built-In Self-Test.

Abdul Wahid Hakmi, Hans-Joachim Wunderlich, Christian G. Zoellin, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel, Laurent Souef

Proceedings of the 2007 IEEE International Test Conference, 2007

A Refined Electrical Model for Particle Strikes and its Impact on SEU Prediction.

Sybille Hellebrand, Christian G. Zoellin, Hans-Joachim Wunderlich, Stefan Ludwig, Torsten Coym, Bernd Straube

Proceedings of the 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 2007

Scan Test Planning for Power Reduction.

Michael E. Imhof, Christian G. Zoellin, Hans-Joachim Wunderlich, Nicolas Mäding, Jens Leenstra

Proceedings of the 44th Design Automation Conference, 2007

2006

BIST Power Reduction Using Scan-Chain Disable in the Cell Processor.

Christian G. Zoellin, Hans-Joachim Wunderlich, Nicolas Mäding, Jens Leenstra

Proceedings of the 2006 IEEE International Test Conference, 2006

2005

Blue Gene/L compute chip: Synthesis, timing, and physical design.

Arthur A. Bright, Ruud A. Haring, Marc Boris Dombrowa, Martin Ohmacht, Dirk Hoenicke, Sarabjeet Singh, James A. Marcella, Robert F. Lembach, Steve M. Douskey, Matthew R. Ellavsky, Christian G. Zoellin, Alan Gara

IBM J. Res. Dev., 2005