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Ming Zhang

Affiliations:
  • Intel, CA, USA
  • University of Illinois at Urbana-Champaign, IL, USA (PhD 2006)


According to our database1, Ming Zhang authored at least 11 papers between 2005 and 2008.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2008
Hierarchical Test Compression for SoC Designs.
[BibTeX]
[DOI]
Kee Sup Kim
,
Ming Zhang
IEEE Des. Test Comput., 2008

2007
Design for Resilience to Soft Errors and Variations.
[BibTeX]
[DOI]
Ming Zhang
,
T. M. Mak
,
James W. Tschanz
,
Kee Sup Kim
,
Norbert Seifert
,
Davia Lu
Proceedings of the 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007

2006
Analysis and Design of Soft-Error Tolerant Circuits
[BibTeX]
[DOI]
Ming Zhang
PhD thesis, 2006

Sequential Element Design With Built-In Soft Error Resilience.
[BibTeX]
[DOI]
Ming Zhang
,
Subhasish Mitra
,
T. M. Mak
,
Norbert Seifert
,
Nicholas J. Wang
,
Quan Shi
,
Kee Sup Kim
,
Naresh R. Shanbhag
,
Sanjay J. Patel
IEEE Trans. Very Large Scale Integr. Syst., 2006

Dual-Sampling Skewed CMOS Design for Soft-Error Tolerance.
[BibTeX]
[DOI]
Ming Zhang
,
Naresh R. Shanbhag
IEEE Trans. Circuits Syst. II Express Briefs, 2006

Soft-Error-Rate-Analysis (SERA) Methodology.
[BibTeX]
[DOI]
Ming Zhang
,
Naresh R. Shanbhag
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2006

Soft Error Resilient System Design through Error Correction.
[BibTeX]
[DOI]
Subhasish Mitra
,
Ming Zhang
,
Norbert Seifert
,
T. M. Mak
,
Kee Sup Kim
Proceedings of the IFIP VLSI-SoC 2006, 2006

Combinational Logic Soft Error Correction.
[BibTeX]
[DOI]
Subhasish Mitra
,
Ming Zhang
,
Saad Waqas
,
Norbert Seifert
,
Balkaran S. Gill
,
Kee Sup Kim
Proceedings of the 2006 IEEE International Test Conference, 2006

2005
Subhasish Mitra, Norbert Seifert, Ming Zhang, Quan Shi, Kee Sup Kim.
[BibTeX]
[DOI]
Subhasish Mitra
,
Norbert Seifert
,
Ming Zhang
,
Quan Shi
,
Kee Sup Kim
Computer, 2005

Logic soft errors: a major barrier to robust platform design.
[BibTeX]
[DOI]
Subhasish Mitra
,
Ming Zhang
,
T. M. Mak
,
Norbert Seifert
,
Victor Zia
,
Kee Sup Kim
Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

An energy-efficient circuit technique for single event transient noise-tolerance.
[BibTeX]
[DOI]
Ming Zhang
,
Naresh R. Shanbhag
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2005), 2005


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