Kee Sup Kim

According to our database, Kee Sup Kim authored at least 35 papers between 1990 and 2014.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2014

13.2 A 14nm FinFET 128Mb 6T SRAM with VMIN-enhancement techniques for low-power applications.

Taejoong Song, Woojin Rim, Jonghoon Jung, Giyong Yang, Jaeho Park, Sunghyun Park, Kang-Hyun Baek, Sanghoon Baek, Sang-Kyu Oh, Jinsuk Jung, Sungbong Kim, Gyu-Hong Kim, Jintae Kim, Young-Keun Lee, Kee Sup Kim, Sang-Pil Sim, Jong Shik Yoon, Kyu-Myung Choi

Proceedings of the 2014 IEEE International Conference on Solid-State Circuits Conference, 2014

2013

Early-life-failure detection using SAT-based ATPG.

Matthias Sauer, Young Moon Kim, Jun Seomun, Hyung-Ock Kim, Kyung Tae Do, Jung Yun Choi, Kee Sup Kim, Subhasish Mitra, Bernd Becker

Proceedings of the 2013 IEEE International Test Conference, 2013

Detection of early-life failures in high-K metal-gate transistors and ultra low-K inter-metal dielectrics.

Young Moon Kim, Jun Seomun, Hyung-Ock Kim, Kyung Tae Do, Jung Yun Choi, Kee Sup Kim, Matthias Sauer, Bernd Becker, Subhasish Mitra

Proceedings of the IEEE 2013 Custom Integrated Circuits Conference, 2013

2012

Thermal-aware body bias modulation for high performance mobile core.

Chungki Oh, Hyung-Ock Kim, Jun Seomun, Wook Kim, Jaehan Jeon, Kyung Tae Do, Hyo-Sig Won, Kee Sup Kim

Proceedings of the International SoC Design Conference, 2012

A 0.65V embedded SDRAM with smart boosting and power management in a 45nm CMOS technology.

Suk-Soo Pyo, Jun-Sung Kim, Jung-Han Kim, Hyun-Taek Jung, Taejoong Song, Cheol-Ha Lee, Gyun-Hong Kim, Young-Keun Lee, Kee Sup Kim

Proceedings of the IEEE 2012 Custom Integrated Circuits Conference, 2012

2011

Apprentice - VTS edition: Season 4.

Kee Sup Kim, Rob Roy

Proceedings of the 29th IEEE VLSI Test Symposium, 2011

Holistic low power solutions for the new world.

Kee Sup Kim

Proceedings of the 2011 International Symposium on Low Power Electronics and Design, 2011

2010

Panel 12C: Apprentice - VTS edition judging session.

Kee Sup Kim

Proceedings of the 28th IEEE VLSI Test Symposium, 2010

Panel 4A: Apprentice - VTS edition: Season 3.

Kee Sup Kim

Proceedings of the 28th IEEE VLSI Test Symposium, 2010

2009

Panel: Apprentice - VTS Edition: Season 2.

Kee Sup Kim

Proceedings of the 27th IEEE VLSI Test Symposium, 2009

Framework for massively parallel testing at wafer and package test.

A. Hakan Baba, Kee Sup Kim

Proceedings of the 27th International Conference on Computer Design, 2009

2008

Hierarchical Test Compression for SoC Designs.

Kee Sup Kim, Ming Zhang

IEEE Des. Test Comput., 2008

2007

Design for Resilience to Soft Errors and Variations.

Ming Zhang, T. M. Mak, James W. Tschanz, Kee Sup Kim, Norbert Seifert, Davia Lu

Proceedings of the 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007

2006

Sequential Element Design With Built-In Soft Error Resilience.

Ming Zhang, Subhasish Mitra, T. M. Mak, Norbert Seifert, Nicholas J. Wang, Quan Shi, Kee Sup Kim, Naresh R. Shanbhag, Sanjay J. Patel

IEEE Trans. Very Large Scale Integr. Syst., 2006

XPAND: An Efficient Test Stimulus Compression Technique.

Subhasish Mitra, Kee Sup Kim

IEEE Trans. Computers, 2006

Session Abstract.

Kee Sup Kim, Mohammad Tehranipoor

Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006

Soft Error Resilient System Design through Error Correction.

Subhasish Mitra, Ming Zhang, Norbert Seifert, T. M. Mak, Kee Sup Kim

Proceedings of the IFIP VLSI-SoC 2006, 2006

Combinational Logic Soft Error Correction.

Subhasish Mitra, Ming Zhang, Saad Waqas, Norbert Seifert, Balkaran S. Gill, Kee Sup Kim

Proceedings of the 2006 IEEE International Test Conference, 2006

OCI: Open Compression Interface.

Bruce Cory, Rohit Kapur, Mick Tegethoff, Mark Kassab, Brion L. Keller, Kee Sup Kim, Dwayne Burek, Steven F. Oakland, Benoit Nadeau-Dostie

Proceedings of the 2006 IEEE International Test Conference, 2006

2005

Subhasish Mitra, Norbert Seifert, Ming Zhang, Quan Shi, Kee Sup Kim.

Subhasish Mitra, Norbert Seifert, Ming Zhang, Quan Shi, Kee Sup Kim

Computer, 2005

Logic soft errors: a major barrier to robust platform design.

Subhasish Mitra, Ming Zhang, T. M. Mak, Norbert Seifert, Victor Zia, Kee Sup Kim

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

XMAX: a practical and efficient compression architecture.

Kee Sup Kim

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

How to determine the necessity for emerging solutions.

Nic Mokhoff, Yervant Zorian, Kamalesh N. Ruparel, Hao Nham, Francesco Pessolano, Kee Sup Kim

Proceedings of the 42nd Design Automation Conference, 2005

Robust platform design in advanced VLSI technologies.

David J. Leavins, Kee Sup Kim, Subhasish Mitra, Eddie J. Rodriguez

Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005

2004

X-compact: an efficient response compaction technique.

Subhasish Mitra, Kee Sup Kim

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2004

2003

Delay Defect Characteristics and Testing Strategies.

Kee Sup Kim, Subhasish Mitra, Paul G. Ryan

IEEE Des. Test Comput., 2003

H-DFT: A Hybrid DFT Architecture For Low-Cost High Quality Structural Testing.

David M. Wu, Mike Lin, Subhasish Mitra, Kee Sup Kim, Anil Sabbavarapu, Talal Jaber, Pete Johnson, Dale March, Greg Parrish

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

XMAX: X-Tolerant Architecture for MAXimal Test Compression.

Subhasish Mitra, Kee Sup Kim

Proceedings of the 21st International Conference on Computer Design (ICCD 2003), 2003

2002

X-Compact: An Efficient Response Compaction Technique for Test Cost Reduction.

Subhasish Mitra, Kee Sup Kim

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2001

DPDAT: data path direct access testing.

Kee Sup Kim, Rathish Jayabharathi, Craig Carstens, Praveen Vishakantaiah, Derek Feltham, Adrian Carbine

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

SpeedGrade: An RTL Path Delay Fault Simulator.

Kee Sup Kim, Rathish Jayabharathi, Craig Carstens

Proceedings of the 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan, 2001

1995

Partial scan flip-flop selection by use of empirical testability.

Kee Sup Kim, Charles R. Kime

J. Electron. Test., 1995

1994

Multi-Frequency, Multi-Phase Scan Chain.

Kee Sup Kim, Len Schultz

Proceedings of the Proceedings IEEE International Test Conference 1994, 1994

1993

Partial Scan Using Reverse Direction Empirical Testability.

Kee Sup Kim, Charles R. Kime

Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993

1990

Partial Scan by Use of Empirical Testability.

Kee Sup Kim, Charles R. Kime

Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, 1990