Mitsuhiro Hamada

According to our database1, Mitsuhiro Hamada authored at least 4 papers between 1984 and 2000.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Other 

Links

On csauthors.net:

Bibliography

2000
A built-in self-repair analyzer (CRESTA) for embedded DRAMs.
Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

1996
A Built-In Self-Test Circuit with Timing Margin Test Function in a 1Gbit Synchronous DRAM.
Proceedings of the Proceedings IEEE International Test Conference 1996, 1996

1986
Redundancy Test for 1 Mbit DRAM Using Multi-Bit-Test Mode.
Proceedings of the Proceedings International Test Conference 1986, 1986

1984
A New Timing Calibration Method for High Speed Memory Test.
Proceedings of the Proceedings International Test Conference 1984, 1984


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