Nathan Kupp

According to our database, Nathan Kupp authored at least 19 papers between 2008 and 2015.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2015

Low-Cost Analog/RF IC Testing Through Combined Intra- and Inter-Die Correlation Models.

Ke Huang, Nathan Kupp, Constantinos Xanthopoulos, John M. Carulli Jr., Yiorgos Makris

IEEE Des. Test, 2015

A comparative study of one-shot statistical calibration methods for analog / RF ICs.

Yichuan Lu, Kiruba S. Subramani, He Huang, Nathan Kupp, Ke Huang, Yiorgos Makris

Proceedings of the 2015 IEEE International Test Conference, 2015

Silicon Demonstration of Statistical Post-Production Tuning.

Yichuan Lu, Kiruba S. Subramani, He Huang, Nathan Kupp, Yiorgos Makris

Proceedings of the 2015 IEEE Computer Society Annual Symposium on VLSI, 2015

2013

Process monitoring through wafer-level spatial variation decomposition.

Ke Huang, Nathan Kupp, John M. Carulli Jr., Yiorgos Makris

Proceedings of the 2013 IEEE International Test Conference, 2013

On combining alternate test with spatial correlation modeling in analog/RF ICs.

Ke Huang, Nathan Kupp, John M. Carulli Jr., Yiorgos Makris

Proceedings of the 18th IEEE European Test Symposium, 2013

Handling discontinuous effects in modeling spatial correlation of wafer-level analog/RF tests.

Ke Huang, Nathan Kupp, John M. Carulli Jr., Yiorgos Makris

Proceedings of the Design, Automation and Test in Europe, 2013

2012

Applying the Model-View-Controller Paradigm to Adaptive Test.

Nathan Kupp, Yiorgos Makris

IEEE Des. Test Comput., 2012

Towards a fully stand-alone analog/RF BIST: A cost-effective implementation of a neural classifier.

Dzmitry Maliuk, Nathan Kupp, Yiorgos Makris

Proceedings of the 30th IEEE VLSI Test Symposium, 2012

Integrated optimization of semiconductor manufacturing: A machine learning approach.

Nathan Kupp, Yiorgos Makris

Proceedings of the 2012 IEEE International Test Conference, 2012

Spatial estimation of wafer measurement parameters using Gaussian process models.

Nathan Kupp, Ke Huang, John M. Carulli Jr., Yiorgos Makris

Proceedings of the 2012 IEEE International Test Conference, 2012

Spatial correlation modeling for probe test cost reduction in RF devices.

Nathan Kupp, Ke Huang, John M. Carulli Jr., Yiorgos Makris

Proceedings of the 2012 IEEE/ACM International Conference on Computer-Aided Design, 2012

2011

Improving Analog and RF Device Yield through Performance Calibration.

Nathan Kupp, He Huang, Yiorgos Makris, Petros Drineas

IEEE Des. Test Comput., 2011

On proving the efficiency of alternative RF tests.

Nathan Kupp, Haralampos-G. D. Stratigopoulos, Petros Drineas, Yiorgos Makris

Proceedings of the 2011 IEEE/ACM International Conference on Computer-Aided Design, 2011

Correlating inline data with final test outcomes in analog/RF devices.

Nathan Kupp, Mustapha Slamani, Yiorgos Makris

Proceedings of the Design, Automation and Test in Europe, 2011

2010

Post-production performance calibration in analog/RF devices.

Nathan Kupp, He Huang, Petros Drineas, Yiorgos Makris

Proceedings of the 2011 IEEE International Test Conference, 2010

DFTT: Design for Trojan Test.

Yier Jin, Nathan Kupp, Yiorgos Makris

Proceedings of the 17th IEEE International Conference on Electronics, 2010

2009

On Boosting the Accuracy of Non-RF to RF Correlation-Based Specification Test Compaction.

Nathan Kupp, Petros Drineas, Mustapha Slamani, Yiorgos Makris

J. Electron. Test., 2009

Experiences in Hardware Trojan Design and Implementation.

Yier Jin, Nathan Kupp, Yiorgos Makris

Proceedings of the IEEE International Workshop on Hardware-Oriented Security and Trust, 2009

2008

Confidence Estimation in Non-RF to RF Correlation-Based Specification Test Compaction.

Nathan Kupp, Petros Drineas, Mustapha Slamani, Yiorgos Makris

Proceedings of the 13th European Test Symposium, 2008