Sidi Ahmed Benhassain

According to our database, Sidi Ahmed Benhassain authored at least 11 papers between 2015 and 2017.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2017

Cognitive approach to support dynamic aging compensation.

Souhir Mhira, Vincent Huard, Ahmed Benhassain, Florian Cacho, David Meyer, Sylvie Naudet, Abhishek Jain, C. R. Parthasarathy, Alain Bravaix

Proceedings of the IEEE International Test Conference, 2017

Dynamic aging compensation and Safety measures in Automotive environment.

Souhir Mhira, Vincent Huard, Ahmed Benhassain, Florian Cacho, Sylvie Naudet, Abhishek Jain, C. R. Parthasarathy, Alain Bravaix

Proceedings of the 23rd IEEE International Symposium on On-Line Testing and Robust System Design, 2017

Investigation of critical path selection for in-situ monitors insertion.

Florian Cacho, Ahmed Benhassain, Riddhi Jitendrakumar Shah, Souhir Mhira, Vincent Huard, Lorena Anghel

Proceedings of the 23rd IEEE International Symposium on On-Line Testing and Robust System Design, 2017

2016

Early system failure prediction by using aging in situ monitors: Methodology of implementation and application results.

Lorena Anghel, Ahmed Benhassain, Ajith Sivadasan, Florian Cacho, Vincent Huard

Proceedings of the 34th IEEE VLSI Test Symposium, 2016

In-situ slack monitors: taking up the challenge of on-die monitoring of variability and reliability.

Ahmed Benhassain, Souhir Mhira, Florian Cacho, Vincent Huard, Lorena Anghel

Proceedings of the 1st IEEE International Verification and Security Workshop, 2016

Activity profiling: Review of different solutions to develop reliable and performant design.

Florian Cacho, Ahmed Benhassain, Souhir Mhira, Ajith Sivadasan, Vincent Huard, P. Cathelin, Vincent Knopik, Abhishek Jain, C. R. Parthasarathy, Lorena Anghel

Proceedings of the 22nd IEEE International Symposium on On-Line Testing and Robust System Design, 2016

Workload Impact on BTI HCI Induced Aging of Digital Circuits: A System level Analysis.

Ajith Sivadasan, Florian Cacho, Sidi Ahmed Benhassain, Vincent Huard, Lorena Anghel

Proceedings of the Workshop on Early Reliability Modeling for Aging and Variability in Silicon Systems, 2016

Study of workload impact on BTI HCI induced aging of digital circuits.

Ajith Sivadasan, Florian Cacho, Sidi Ahmed Benhassain, Vincent Huard, Lorena Anghel

Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition, 2016

Early failure prediction by using in-situ monitors: Implementation and application results.

Ahmed Benhassain, Florian Cacho, Vincent Huard, Lorena Anghel

Proceedings of the Workshop on Early Reliability Modeling for Aging and Variability in Silicon Systems, 2016

2015

Digital circuits reliability with in-situ monitors in 28nm fully depleted SOI.

M. Saliva, Florian Cacho, Vincent Huard, X. Federspiel, D. Angot, Ahmed Benhassain, Alain Bravaix, Lorena Anghel

Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, 2015

Timing in-situ monitors: Implementation strategy and applications results.

Ahmed Benhassain, Florian Cacho, Vincent Huard, M. Saliva, Lorena Anghel, C. R. Parthasarathy, Abhishek Jain, Fabien Giner

Proceedings of the 2015 IEEE Custom Integrated Circuits Conference, 2015