Stefan Spinner

According to our database, Stefan Spinner authored at least 4 papers between 2007 and 2008.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2008

Automatic Test Pattern Generation for Interconnect Open Defects.

Stefan Spinner, Ilia Polian, Piet Engelke, Bernd Becker, Martin Keim, Wu-Tung Cheng

Proceedings of the 26th IEEE VLSI Test Symposium (VTS 2008), April 27, 2008

Diagnosis of Realistic Defects Based on the X-Fault Model.

Ilia Polian, Kohei Miyase, Yusuke Nakamura, Seiji Kajihara, Piet Engelke, Bernd Becker, Stefan Spinner, Xiaoqing Wen

Proceedings of the 11th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2008), 2008

2007

Electromechanical Reliability Testing of Three-Axial Silicon Force Sensors

Stefan Spinner, Julian Bartholomeyczik, Bernd Becker, Michael Doelle, Oliver Paul, Ilia Polian, Roland Roth, Karl Seitz, Patrick Ruther

CoRR, 2007

Simulating Open-Via Defects.

Stefan Spinner, Jie Jiang, Ilia Polian, Piet Engelke, Bernd Becker

Proceedings of the 16th Asian Test Symposium, 2007