Thibault Kempf

According to our database, Thibault Kempf authored at least 4 papers between 2018 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2023

40nm SONOS Embedded Select in Trench Memory.

Radouane Habhab, Vincenzo Della Marca, Pascal Masson, Nadia Miridi, Clement Pribat, Simon Jeannot, Thibault Kempf, Marc Mantelli, Philippe Lorenzini, Jean-Marc Voisin, Arnaud Régnier, Stephan Niel, Francesco La Rosa

Proceedings of the 53rd IEEE European Solid-State Device Research Conference, 2023

2021

Hot Electron Source Side Injection Comprehension in 40nm eSTM™.

Franck Melul, Thibault Kempf, Vincenzo Della Marca, Marc Bocquet, Madjid Akbal, Frederique Trenteseaux, Marc Mantelli, Arnaud Régnier, Stephan Niel, Francesco La Rosa

Proceedings of the IEEE International Memory Workshop, 2021

2018

Quantitative correlation between Flash and equivalent transistor for endurance electrical parameters extraction.

Vincenzo Della Marca, Jérémy Postel-Pellerin, Thibault Kempf, Arnaud Régnier, Philippe Chiquet, Marc Bocquet

Microelectron. Reliab., 2018

Threshold voltage bitmap analysis methodology: Application to a 512kB 40nm Flash memory test chip.

Thibault Kempf, Vincenzo Della Marca, L. Baron, F. Maugain, Francesco La Rosa, Stephan Niel, Arnaud Régnier, Jean-Michel Portal, Pascal Masson

Proceedings of the IEEE International Reliability Physics Symposium, 2018