Thomas Bartenstein

According to our database, Thomas Bartenstein authored at least 10 papers between 1997 and 2014.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

2014

Rate types for stream programs.

Thomas Bartenstein, Yu David Liu

Proceedings of the 2014 ACM International Conference on Object Oriented Programming Systems Languages & Applications, 2014

2013

Green streams for data-intensive software.

Thomas Bartenstein, Yu David Liu

Proceedings of the 35th International Conference on Software Engineering, 2013

2010

Reduction of Test Data Volume and Improvement of Diagnosability Using Hybrid Compression.

Anis Uzzaman, Brion L. Keller, Brian Foutz, Sandeep Bhatia, Thomas Bartenstein, Masayuki Arai, Kazuhiko Iwasaki

IEICE Trans. Inf. Syst., 2010

2008

Optimizing Test Data Volume Using Hybrid Compression.

Brion L. Keller, Sandeep Bhatia, Thomas Bartenstein, Brian Foutz, Anis Uzzaman

Proceedings of the 17th IEEE Asian Test Symposium, 2008

2005

Use of MISRs for compression and diagnostics.

Brion L. Keller, Thomas Bartenstein

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

2004

An Economic Analysis and ROI Model for Nanometer Test.

Brion L. Keller, Mick Tegethoff, Thomas Bartenstein, Vivek Chickermane

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

Panel 9 - Diagnostics vs. Failure Analysis.

Thomas Bartenstein

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

2001

Diagnosing combinational logic designs using the single location at-a-time (SLAT) paradigm.

Thomas Bartenstein, Douglas Heaberlin, Leendert M. Huisman, David Sliwinski

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

2000

Fault distinguishing pattern generation.

Thomas Bartenstein

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

1997

Fault Model Extension for Diagnosing Custom Cell Fails.

Gilbert Vandling, Thomas Bartenstein

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997