Tom Burd

According to our database, Tom Burd authored at least 7 papers between 2008 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

2023

"Zen 4": The AMD 5nm 5.7GHz x86-64 Microprocessor Core.

Benjamin Munger, Kathy Wilcox, Jeshuah Sniderman, Chuck Tung, Brett Johnson, Russell Schreiber, Carson Henrion, Kevin Gillespie, Tom Burd, Harry R. Fair III, Dave Johnson, Jonathan White, Scott McLelland, Steven Bakke, Javin Olson, Ryan McCracken, Matthew Pickett, Aaron Horiuchi, Hien Nguyen, Tim Jackson

Proceedings of the IEEE International Solid- State Circuits Conference, 2023

Temperature-Aware Sizing of Multi-Chip Module Accelerators for Multi-DNN Workloads.

Prachi Shukla, Derrick Aguren, Tom Burd, Ayse K. Coskun, John Kalamatianos

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2023

2017

Bristol Ridge: A 28-nm × 86 Performance-Enhanced Microprocessor Through System Power Management.

Sriram Sundaram, Aaron Grenat, Samuel Naffziger, Tom Burd, Stephen Kosonocky, Steven Liepe, Ravinder Rachala, Miguel Rodriguez, Michael Austin, Sriram Sambamurthy

IEEE J. Solid State Circuits, 2017

2016

Carrizo: A High Performance, Energy Efficient 28 nm APU.

Benjamin Munger, David Akeson, Srikanth Arekapudi, Tom Burd, Harry R. Fair III, Jim Farrell, Dave Johnson, Guhan Krishnan, Hugh McIntyre, Edward McLellan, Samuel Naffziger, Russell Schreiber, Sriram Sundaram, Jonathan White, Kathryn Wilcox

IEEE J. Solid State Circuits, 2016

4.2 Increasing the performance of a 28nm x86-64 microprocessor through system power management.

Aaron Grenat, Sriram Sundaram, Stephen Kosonocky, Ravinder Rachala, Sriram Sambamurthy, Steven Liepe, Miguel Rodriguez, Tom Burd, Adam Clark, Michael Austin, Samuel Naffziger

Proceedings of the 2016 IEEE International Solid-State Circuits Conference, 2016

2009

Constraint Management and Checking in Template-Based Circuit Designs.

Richard Bartolotti, Tom Burd, Brian McMinn, Arun Chandra

Proceedings of the 10th International Workshop on Microprocessor Test and Verification, 2009

2008

Context-sensitive static transistor-level IR analysis.

Weiqing Guo, Yu Zhong, Tom Burd

Proceedings of the 2008 International Conference on Computer-Aided Design, 2008