Tze Wee Chen

According to our database, Tze Wee Chen authored at least 6 papers between 2005 and 2010.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2010

Gate-oxide early-life failure identification using delay shifts.

Young Moon Kim, Tze Wee Chen, Yoshio Kameda, Masayuki Mizuno, Subhasish Mitra

Proceedings of the 28th IEEE VLSI Test Symposium, 2010

2009

ESD design challenges and strategies in deeply-scaled integrated circuits.

Shuqing Cao, Tze Wee Chen, Stephen G. Beebe, Robert W. Dutton

Proceedings of the IEEE Custom Integrated Circuits Conference, 2009

2008

Gate-Oxide Early Life Failure Prediction.

Tze Wee Chen, Kyunglok Kim, Young Moon Kim, Subhasish Mitra

Proceedings of the 26th IEEE VLSI Test Symposium (VTS 2008), April 27, 2008

2006

Post-breakdown leakage resistance and its dependence on device area.

Tze Wee Chen, Choshu Ito, William Loh, Robert W. Dutton

Microelectron. Reliab., 2006

Synthesized Compact Models and Experimental Verifications for Substrate Noise Coupling in Mixed-Signal ICs.

Hai Lan, Tze Wee Chen, Chi On Chui, Parastoo Nikaeen, Jae Wook Kim, Robert W. Dutton

IEEE J. Solid State Circuits, 2006

2005

Synthesized compact model and experimental results for substrate noise coupling in lightly doped processes.

Hai Lan, Tze Wee Chen, Chi On Chui, Parastoo Nikaeen, Jae Wook Kim, Robert W. Dutton

Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005