Vitali Sokhin

According to our database, Vitali Sokhin authored at least 10 papers between 2011 and 2022.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2022

Random Test Generation of Application Programming Interfaces.

Eitan Farchi, Krithika Prakash, Vitali Sokhin

CoRR, 2022

2021

Post Silicon Validation of the MMU.

Tom Kolan, Hillel Mendelson, Vitali Sokhin, Shai Doron, Hernan Theiler, Shay Aviv, Hagai Hadad, Natalia Freidman, Elena Tsanko, John M. Ludden, Bryant Cockcroft

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2021

2020

Post-Silicon Validation of the IBM POWER9 Processor.

Tom Kolan, Hillel Mendelson, Vitali Sokhin, Kevin Reick, Elena Tsanko, Greg Wetli

Proceedings of the 2020 Design, Automation & Test in Europe Conference & Exhibition, 2020

2017

Test Generation Methods for Utilization Improvement of Hardware-Accelerated Simulation Platforms.

Wisam Kadry, Dmitry Krestyashyn, Arkadiy Morgenshtein, Amir Nahir, Vitali Sokhin, Jin Sung Park, Sung-Boem Park, Wookyeong Jeong, Jae-Cheol Son

IEEE Des. Test, 2017

2016

Unveiling difficult bugs in address translation caching arrays for effective post-silicon validation.

George Papadimitriou, Dimitris Gizopoulos, Athanasios Chatzidimitriou, Tom Kolan, Anatoly Koyfman, Ronny Morad, Vitali Sokhin

Proceedings of the 34th IEEE International Conference on Computer Design, 2016

Probabilistic bug-masking analysis for post-silicon tests in microprocessor verification.

Doowon Lee, Tom Kolan, Arkadiy Morgenshtein, Vitali Sokhin, Ronny Morad, Avi Ziv, Valeria Bertacco

Proceedings of the 53rd Annual Design Automation Conference, 2016

2015

Comparative study of test generation methods for simulation accelerators.

Wisam Kadry, Dmitry Krestyashyn, Arkadiy Morgenshtein, Amir Nahir, Vitali Sokhin, Jin Sung Park, Sung-Boem Park, Wookyeong Jeong, Jae-Cheol Son

Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, 2015

2014

Effective post-silicon failure localization using dynamic program slicing.

Ophir Friedler, Wisam Kadry, Arkadiy Morgenshtein, Amir Nahir, Vitali Sokhin

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014

2013

Improving Post-silicon Validation Efficiency by Using Pre-generated Data.

Wisam Kadry, Anatoly Koyfman, Dmitry Krestyashyn, Shimon Landa, Amir Nahir, Vitali Sokhin

Proceedings of the Hardware and Software: Verification and Testing, 2013

2011

Threadmill: a post-silicon exerciser for multi-threaded processors.

Allon Adir, Maxim Golubev, Shimon Landa, Amir Nahir, Gil Shurek, Vitali Sokhin, Avi Ziv

Proceedings of the 48th Design Automation Conference, 2011