Wen Yueh

According to our database, Wen Yueh authored at least 9 papers between 2012 and 2016.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2016

Thermally Adaptive Cache Access Mechanisms for 3D Many-Core Architectures.

He Xiao, Wen Yueh, Saibal Mukhopadhyay, Sudhakar Yalamanchili

IEEE Comput. Archit. Lett., 2016

2015

A Memory-Based Logic Block With Optimized-for-Read SRAM for Energy-Efficient Reconfigurable Computing Fabric.

Wen Yueh, Subho Chatterjee, Muneeb Zia, Swarup Bhunia, Saibal Mukhopadhyay

IEEE Trans. Circuits Syst. II Express Briefs, 2015

Experimental characterization of in-package microfluidic cooling on a System-on-Chip.

Wen Yueh, Zhimin Wan, Yogendra Joshi, Saibal Mukhopadhyay

Proceedings of the IEEE/ACM International Symposium on Low Power Electronics and Design, 2015

2014

In Situ Power Gating Efficiency Learner for Fine-Grained Self-Adaptive Power Gating.

Amit Ranjan Trivedi, Wen Yueh, Saibal Mukhopadhyay

IEEE Trans. Circuits Syst. II Express Briefs, 2014

2013

Perceptual quality preserving SRAM architecture for color motion pictures.

Wen Yueh, Minki Cho, Saibal Mukhopadhyay

Proceedings of the Design, Automation and Test in Europe, 2013

Role of power grid in side channel attack and power-grid-aware secure design.

Xinmu Wang, Wen Yueh, Debapriya Basu Roy, Seetharam Narasimhan, Yu Zheng, Saibal Mukhopadhyay, Debdeep Mukhopadhyay, Swarup Bhunia

Proceedings of the 50th Annual Design Automation Conference 2013, 2013

On the potential of 3D integration of inductive DC-DC converter for high-performance power delivery.

Sergio Carlo, Wen Yueh, Saibal Mukhopadhyay

Proceedings of the 50th Annual Design Automation Conference 2013, 2013

2012

Improving IC Security Against Trojan Attacks Through Integration of Security Monitors.

Seetharam Narasimhan, Wen Yueh, Xinmu Wang, Saibal Mukhopadhyay, Swarup Bhunia

IEEE Des. Test Comput., 2012

On the parametric failures of SRAM in a 3D-die stack considering tier-to-tier supply cross-talk.

Wen Yueh, Subho Chatterjee, Amit Ranjan Trivedi, Saibal Mukhopadhyay

Proceedings of the 30th IEEE VLSI Test Symposium, 2012