Yen-Pu Chen

According to our database, Yen-Pu Chen authored at least 6 papers between 2018 and 2022.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2022

Correlated Effects of Radiation and Hot Carrier Degradation on the Performance of LDMOS Transistors.

Bikram Kishore Mahajan, Yen-Pu Chen, Ulisses Alberto Heredia Rivera, Rahim Rahimi, Muhammad Ashraful Alam

Proceedings of the IEEE International Reliability Physics Symposium, 2022

A Critical Examination of the TCAD Modeling of Hot Carrier Degradation for LDMOS Transistors.

Bikram Kishore Mahajan, Yen-Pu Chen, Muhammad Ashraful Alam, Dhanoop Varghese, Srikanth Krishnan, Vijay Reddy

Proceedings of the IEEE International Reliability Physics Symposium, 2022

2021

Quantifying Region-Specific Hot Carrier Degradation in LDMOS Transistors Using a Novel Charge Pumping Technique.

Bikram Kishore Mahajan, Yen-Pu Chen, Dhanoop Varghese, Vijay Reddy, Srikanth Krishnan, Muhammad Ashraful Alam

Proceedings of the IEEE International Reliability Physics Symposium, 2021

2020

A Novel 'I-V Spectroscopy' Technique to Deconvolve Threshold Voltage and Mobility Degradation in LDMOS Transistors.

Yen-Pu Chen, Bikram Kishore Mahajan, Dhanoop Varghese, Srikanth Krishnan, Vijay Reddy, Muhammad Ashraful Alam

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2019

An Analytical Transient Joule Heating Model for an Interconnect in a Modern IC: Material Selection (Cu, Co, Ru) and Cooling Strategies.

Woojin Ahn, Yen-Pu Chen, Muhammad Ashraful Alam

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018

High voltage time-dependent dielectric breakdown in stacked intermetal dielectrics.

SangHoon Shin, Yen-Pu Chen, Woojin Ahn, Honglin Guo, Byron Williams, Jeff West, Tom Bonifield, Dhanoop Varghese, Srikanth Krishnan, Muhammad Ashraful Alam

Proceedings of the IEEE International Reliability Physics Symposium, 2018