SangHoon Shin

According to our database1, SangHoon Shin authored at least 2 papers between 2015 and 2018.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Other 

Links

On csauthors.net:

Bibliography

2018
High voltage time-dependent dielectric breakdown in stacked intermetal dielectrics.
Proceedings of the IEEE International Reliability Physics Symposium, 2018

2015
Characterization and reliability of III-V gate-all-around MOSFETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2015


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